|
|
Volumn 387, Issue 1-2, 2001, Pages 246-250
|
|
TEM, AFM, and cathodoluminescence characterization of CdTe thin films
|
|
Author keywords
Atomic force microscopy (AFM); Cathodoluminescence (CL); CdTe; Solar cells; Transmission electron microscopy (TEM)
|
|
Indexed keywords
ATOMIC FORCE MICROSCOPY;
CATHODOLUMINESCENCE;
CRYSTAL MICROSTRUCTURE;
DEPOSITION;
GRAIN GROWTH;
GRAIN SIZE AND SHAPE;
HEAT TREATMENT;
MORPHOLOGY;
POLYCRYSTALLINE MATERIALS;
SEMICONDUCTING CADMIUM COMPOUNDS;
STACKING FAULTS;
SUBLIMATION;
THIN FILMS;
TRANSMISSION ELECTRON MICROSCOPY;
POST-DEPOSITION HEAT TREATMENT;
SOLAR CELLS;
|
|
EID: 0035967606
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(00)01707-7 Document Type: Article |
|
Times cited : (28)
|
|
References (12)
|
