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Volumn 48, Issue 9 Part 1, 2009, Pages 0912021-0912024

Nanoscale characterization of microcrystalline silicon solar cells by scanning near-field optical microscopy

(7) Gotoh, Tamihiro a Yamamoto, Yoshiki b Shen, Zhenhua b Ogawa, Shunsuke b Yoshida, Norimitsu b Itoh, Takashi b Nonomura, Shuichi b

a GUNMA UNIVERSITY (Japan)

b GIFU UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVE ATOMIC FORCE MICROSCOPY; FIBER PROBE; HYDROGENATED MICROCRYSTALLINE SILICON; INHOMOGENEITIES; MAPPING TECHNIQUES; NANOSCALE CHARACTERIZATION; NANOSCALE JUNCTIONS; NEAR-FIELD; QUALITY MONITORING; SCANNING NEAR-FIELD MICROSCOPES; SCANNING NEAR-FIELD OPTICAL MICROSCOPY; SCANNING PROBES; SI LAYER; SOLAR CELL PERFORMANCE;

ATOMIC FORCE MICROSCOPY; HYDROGENATION; MICROCRYSTALLINE SILICON; NANOSTRUCTURED MATERIALS; OPTICAL DATA STORAGE; OPTICAL INSTRUMENTS; PROBES; SCANNING; SCANNING ELECTRON MICROSCOPY; SILICON SOLAR CELLS; SOLAR CELLS; SOLAR POWER GENERATION;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 77952707238 PISSN: 00214922 EISSN: 13474065 Source Type: Journal
DOI: 10.1143/JJAP.48.091202 Document Type: Article

Times cited : (4)

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