Physical characterization of thin-film solar cells

Progress in Photovoltaics: Research and Applications

Volumn 12, Issue 2-3, 2004, Pages 177-217

  Durose, Ken ^a   Asher, Sally E ^b   Jaegermann, Wolfram ^c   Levi, Dean ^b   McCandless, Brian E ^d   Metzger, Wyatt ^b   Moutinho, Helio ^b   Paulson, P D ^d   Perkins, Craig L ^b   Sites, James R ^e   Teeter, Glenn ^b   Terheggen, Mathias ^f  

^a DURHAM UNIVERSITY   (United Kingdom)

^b NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

^c DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^d UNIVERSITY OF DELAWARE   (United States)

^e Department of Environmental and Radiological Health Sciences   (United States)

^f ETH ZURICH   (Switzerland)

Author keywords

Characterization; Chemical analysis; Microstructure; Optical properties; Spatially resolved functionality; Thin film solar cell

Indexed keywords

AMORPHOUS SILICON; AUGER ELECTRON SPECTROSCOPY; CHEMICAL ANALYSIS; ELLIPSOMETRY; MICROSTRUCTURE; PHOTOLUMINESCENCE; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTING CADMIUM TELLURIDE; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTRON BEAM INDUCED CURRENT; LIGH BEAM INDUCED CURRENT; SCANNING PROBE MICROSCOPY; SPATIALLY RESOLVED FUNCTIONALITY; SPECTROSCOPIC ELLIPSOMETRY; THIN FILM SOLAR CELLS; TIME RESOLVED PHOTOLUMINESCENCE;

SOLAR CELLS;

MICROSTRUCTURE; PHOTOVOLTAIC SYSTEM;

EID: 1842628556     PISSN: 10627995     EISSN: None     Source Type: Journal    
DOI: 10.1002/pip.542     Document Type: Article

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