Electronically active layers and interfaces in polycrystalline devices: Cross-section mapping of CdS/CdTe solar cells

Applied Physics Letters

Volumn 83, Issue 24, 2003, Pages 4924-4926

  Visoly Fisher, Iris ^a   Cohen, Sidney R ^a   Cahen, David ^a   Ferekides, Christos S ^b  

^a WEIZMANN INSTITUTE OF SCIENCE   (Israel)

^b UNIVERSITY OF SOUTH FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM COMPOUNDS; CAPACITANCE; COMPOSITION; INTERFACES (MATERIALS); MATHEMATICAL MODELS; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR JUNCTIONS; THRESHOLD VOLTAGE;

COMPOSITIONAL ANALYSIS; CROSS SECTION MAPPING; ELECTRONIC MAPPING; ELECTRONICALLY ACTIVE LAYERS AND INTERFACES; HIGH RESISTANCE KELVIN PROBE MICROSCOPY; METALLURGICAL JUNCTIONS; PHOTOVOLTAIC JUNCTIONS; POLYCRYSTALLINE DEVICES; SCANNING KELVIN PROBE MICROSCOPY;

CADMIUM SULFIDE SOLAR CELLS;

EID: 0347133647     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1632532     Document Type: Article

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