Mechanism of bias-dependent contrast in scanning-capacitance-microscopy images

Applied Physics Letters

Volumn 79, Issue 19, 2001, Pages 3182-3184

  Smoliner, J ^a   Basnar, B ^a   Golka, S ^a   Gornik, E ^a   Loffler B ^b   Schatzmayr, M ^b   Enichlmair, H ^b  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b AMS AG   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001517291     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1415044     Document Type: Article

References (15)

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