Surface potential of chalcopyrite films measured by KPFM

Physica Status Solidi (A) Applications and Materials Science

Volumn 203, Issue 11, 2006, Pages 2571-2580

  Sadewasser, S ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHALCOPYRITE; KELVIN PROBE FORCE MICROSCOPY (KPFM); SURFACE POTENTIAL; WORK FUNCTION;

ATOMIC FORCE MICROSCOPY; DEPOSITION; GRAIN BOUNDARIES; POLYCRYSTALLINE MATERIALS; SOLAR CELLS; SURFACE TOPOGRAPHY; ULTRAHIGH VACUUM;

SEMICONDUCTING FILMS;

EID: 33749070095     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200669573     Document Type: Article

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