Single-photon detectors for ultra-low-voltage time-resolved emission measurements of VLSI circuits

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8033, Issue , 2011, Pages

  Stellari, F ^a   Song, P ^a   Weger, A J ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

Picosecond imaging for circuit analysis (PICA); Single photon avalanche diode (SPAD); Superconducting single photon detector (SSPD); Time resolved emission (TRE)

Indexed keywords

CMOS CIRCUITS; ELECTRICAL SIGNAL; LOW-VOLTAGE APPLICATIONS; NON-INVASIVE; PICOSECOND IMAGING FOR CIRCUIT ANALYSIS (PICA); SINGLE PHOTON AVALANCHE DIODE (SPAD); SINGLE-PHOTON AVALANCHE PHOTODIODES; SINGLE-PHOTON DETECTORS; SOI TECHNOLOGY; STATE OF THE ART; SUPERCONDUCTING SINGLE-PHOTON DETECTORS; SUPPLY VOLTAGE REDUCTION; TEST VEHICLE; TIME-RESOLVED EMISSIONS; ULTRA-LOW-VOLTAGE;

AVALANCHE PHOTODIODES; CMOS INTEGRATED CIRCUITS; DETECTORS; ELECTRIC NETWORK ANALYSIS; PARTICLE BEAMS; SUPERCONDUCTIVITY; VLSI CIRCUITS;

PHOTONS;

EID: 79960537815     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.883955     Document Type: Conference Paper

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