Optical and Electrical Testing of Latchup in I/O Interface Circuits

IEEE International Test Conference (TC)

Volumn , Issue , 2003, Pages 236-245

  Stellari, Franco ^a   Song, Peilin ^a   McManus, Moyra K ^a   Gauthier, Robert ^b   Weger, Alan J ^a   Chatty, Kiran ^b   Muhammad, Mujahid ^b   Sanda, Pia ^c  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b IBM MICROELECTRONICS   (United States)

^c IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC DISCHARGES; ELECTRIC VARIABLES MEASUREMENT; ELECTROSTATICS; IGNITION; LOGIC CIRCUITS; OPTICAL TESTING;

EMISSION MICROSCOPY (EMMI);

FLIP FLOP CIRCUITS;

EID: 0142246942     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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