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Conference Proceedings from the International Symposium for Testing and Failure Analysis

Volumn , Issue , 2002, Pages 645-653

Prospects of Time-Resolved Photon Emission as a Debug Tool

(3) Vickers, Jim a Pakdaman, Nader a Kasapi, Steven a

a Optonics Inc (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DYNAMIC EMISSION SYSTEMS; PHOTON EMISSION; SINGLE-PHOTON AVALANCHE DETECTORS (SPAD);

ABSORPTION; APPROXIMATION THEORY; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; DATA ACQUISITION; DOPING (ADDITIVES); ELECTRIC POWER UTILIZATION; ENERGY GAP; FAILURE ANALYSIS; OPTIMIZATION; POISSON DISTRIBUTION; PROBABILITY; QUANTUM EFFICIENCY; SILICON ON INSULATOR TECHNOLOGY; SPURIOUS SIGNAL NOISE; TRANSISTORS;

ELECTRON EMISSION;

EID: 0344091931 PISSN: None EISSN: None Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper

Times cited : (36)

References (11)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.