The European nanometrology landscape

Nanotechnology

Volumn 22, Issue 6, 2011, Pages

  Leach, Richard K ^a   Boyd, Robert ^a   Burke, Theresa ^b   Danzebrink, Hans Ulrich ^c   Dirscherl, Kai ^d   Dziomba, Thorsten ^c   Gee, Mark ^a   Koenders, Ludger ^c   Morazzani, Valérie ^e   Pidduck, Allan ^f   Roy, Debdulal ^a   Unger, Wolfgang E S ^g   Yacoot, Andrew ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^b European Society for Precision Engineering and Nanotechnology   (United Kingdom)

^c PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^d DANISH FUNDAMENTAL METROLOGY   (Denmark)

^e LABORATOIRE NATIONAL DE MÉTROLOGIE ET D ESSAIS LNE   (France)

^f QINETIQ   (United Kingdom)

^g Federal Institute for Materials Research and Testing   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT STATUS; CURRENT TECHNIQUES; FILM PARAMETERS; FUNCTIONAL PROPERTIES; FUTURE DIRECTIONS; INDUSTRIAL MEASUREMENTS; KEY MATERIALS; MECHANICAL AND ELECTRICAL PROPERTIES; NANO SCALE; NANOMETROLOGY; SKILLS DEVELOPMENT;

MECHANICAL PROPERTIES; NANOSTRUCTURED MATERIALS;

ELECTRIC PROPERTIES;

EID: 79251640221     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/22/6/062001     Document Type: Review

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