Quantification issues in ToF-SSIMS and AFM co-analysis in two-phase systems, exampled by a polymer blend

Surface and Interface Analysis

Volumn 35, Issue 11, 2003, Pages 888-896

  Gilmore, I S ^a   Seah, M P ^a   Johnstone, J E ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

AFM; Force modulation; G SIMS; Polymer blend; Quantification; Static SIMS

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELASTIC MODULI; IRRADIATION; MONOLAYERS; POLYCARBONATES; POLYVINYL CHLORIDES; SECONDARY ION MASS SPECTROMETRY; SUBSTRATES; SURFACE PROPERTIES; SURFACE TOPOGRAPHY; SURFACE TREATMENT;

FORCE MODULATION MICROSCOPY; FRACTIONAL AREAS; SUBSURFACE DAMAGE;

POLYMER BLENDS;

EID: 0344899172     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1616     Document Type: Article

References (29)

1. Briggs, D. In ToF-SIMS Surface Analysis by Mass Spectrometry, Vickerman JC, Briggs D (eds). IM Publications & SurfaceSpectra: Manchester, 2001; 497-524.
2. Galuska AA. Surf. Interface Anal. 1994; 21: 703.
3. Vanden Eynde X, Bertrand P, Jerome R. Macromolecules 1997; 30: 6407.
4. Galsuka AA. Surf. Interface Anal. 1997; 25: 790.
5. Benninghoven A. In Ion Formation from Organic Solids, Benninghoven A (ed.). Springer Series in Chemical Physics 25. Springer: Berlin, 1982; 65.
6. Briggs D, Hearn M. Vacuum 1986; 36: 1005.
7. Delcorte A, Weng LT, Bertrand P. Nucl. Instrum. Methods B 1995; 10: 213.
8. Gilmore IS, Seah MP. Surf. Interface Anal. 1996; 24: 746.
9. Jackson S, Short RD. J. Mater. Chem. 1992, 2: 259.
10. Short, RD, Amean AP, Jackson ST, Pawson DJ, O'Toole L, Wood AJ. Vacuum 1993; 44: 1143.
11. Briggs D, Fletcher IW, Reichlmaier S, Agulo-Sanchez JL, Short RD. Surf. Interface Anal. 1996, 24: 419.
12. Nysten B, Verfaillie G, Ferain E, Legras E, Lhoest J-B, Poleunis C, Bertrand P. Microsc. Microanal. Microstruct. 1994; 5: 373.
13. Feng J, Weng LT, Li L, Chan CM, Surf. Interface Anal. 2000; 29: 168.
14. Zeng XM, Weng LT, Li L, Chan CM, Liu SY, Jiang M. Surf. Interface Anal. 2001; 31: 421.
15. Galuska AA, Poulter RR, McElratti KO. Surf. Interface Anal. 1997; 25: 418.
16. Schwieters J, Cramer H-G, Heller T, Jürgens U, Niehus E, Zehnphenning J, Benninghoven A. J. Vac. Sci. Technol. A 1991; 9: 2864.
17. Gilmore IS, Seah MP. Appl. Surf. Sci. 2002; 187: 89.
18. Gilmore IS, Seah MP. Surf. Interface Anal. 1995; 23: 248.
19. Kiridena W, Jain V, Kuo PK, Lui G. Surf. Interface Anal. 1997; 25: 383.
20. Jing J, Henriksen PN, Wang H. J. Mater Sci. 1995; 30: 5700.
21. Kaye GWC, Labe TH. Tables of Physical and Chemical Constants (16th edn). Longmans: Harlow, 1995.
22. Vickerman JC, Briggs D, Henderson A. The Static SIMS Library, version 2. SurfaceSpectra: Manchester, 1999.
23. Weng LT, Bertrand P, Laver W, Zimmer R, Bussetti S. Surf. Interface Anal. 1995; 23: 879.
24. Gilmore IS, Seah MP. Appl. Surf. Sci. 2000; 161: 465.
25. Briggs D, Seah MP. Practical Surface Analysis, Volume 1, Auger and X-ray photoelectron spectroscopy (2nd edn). John Wiley: Chichester, 1990; 245.
26. Delcorte A, Bertrand P, Arys X, Jonas A, Wischerhoff E, Mayer B, Laschewsky A. Surf. Sci. 1996; 366: 149.
27. Ziegler JF, Biersack JP. SRIM-96, Stopping and Range of Ions in Matter. 1996, www.srim.org
28. based on developments from J. P. Biersack and L. Haggmark, Nucl. Instr. and Math., vol. 174, 257, 1980
29. and from J. F. Ziegler, The Stopping and Range of Ions in Matter, Vol. 2-6, Pergamon Press, 1977-1985.