Quantitative XPS depth profiling of codeine loaded poly(l-lactic acid) films using a coronene ion sputter source

Journal of Controlled Release

Volumn 138, Issue 1, 2009, Pages 40-44

  Rafati, Ali ^a   Davies, Martyn C ^a   Shard, Alexander G ^b   Hutton, Simon ^c   Mishra, Gautam ^c   Alexander, Morgan R ^a  

^a UNIVERSITY OF NOTTINGHAM   (United Kingdom)

^b NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^c Kratos Analytical Ltd   (United Kingdom)

Author keywords

Depth profiling; Drug eluting polymer; PLA; Quantitative; XPS

Indexed keywords

ACTIVE PHARMACEUTICAL INGREDIENTS; ATOMIC CONCENTRATION; BULK LOADING; CHARACTERISATION; CONTROLLED RELEASE; CORONENE; DELIVERY DEVICE; DELIVERY SYSTEMS; DRUG DISTRIBUTION; DRUG ELUTING POLYMER; DRUG-ELUTING STENT; DRUG-ELUTING STENTS; FLAT FILMS; IN-VITRO; MATRIX; PLA; POLY(L-LACTIC ACID); POLYMER DEVICES; QUANTITATIVE; SPUTTER SOURCES; SPUTTER TIME; SURFACE DEPLETION; UNIFORM DISTRIBUTION; XPS; XPS ANALYSIS; XPS DEPTH PROFILING;

BODY FLUIDS; CONTROLLED DRUG DELIVERY; DRUG PRODUCTS; LACTIC ACID; ORGANIC ACIDS; POLYMER FILMS; POLYMERS; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS; X RAY PHOTOELECTRON SPECTROSCOPY;

DEPTH PROFILING;

CHLOROFORM; CODEINE; CORONENE; POLYLACTIC ACID; POLYMER; SILICON;

ARTICLE; CONTROLLED DRUG RELEASE; CONTROLLED STUDY; DRUG DELIVERY SYSTEM; DRUG DISTRIBUTION; DRUG ELUTING STENT; DRUG STRUCTURE; ELLIPSOMETRY; FILM COATING; IN VITRO STUDY; IN VIVO STUDY; PRIORITY JOURNAL; THICKNESS; X RAY PHOTOELECTRON SPECTROSCOPY;

CODEINE; DELAYED-ACTION PREPARATIONS; DRUG-ELUTING STENTS; LACTIC ACID; MOLECULAR STRUCTURE; POLYCYCLIC COMPOUNDS; POLYMERS; SPECTROMETRY, X-RAY EMISSION; SURFACE PROPERTIES;

EID: 67650564772     PISSN: 01683659     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jconrel.2009.05.005     Document Type: Article

References (22)

1. Braun R.M., Cheng J., Parsonage E.E., Moeller J., and Winograd N. Surface and depth profiling investigation of a drug-loaded copolymer utilized to coat Taxus Express(2) stents. Analytical Chemistry 78 24 (2006) 8347-8353
2. Kang E., Wang H., Kwon I.K., Song Y.H., Kamath K., Miller K.M., Barry J., Cheng J.X., and Park K. Application of coherent anti-Stokes Raman scattering microscopy to image the changes in a paclitaxel-poly(styrene-b-isobutylene-b-styrene) matrix pre- and post-drug elution. Journal of Biomedical Materials Research Part A 87A 4 (2008) 913-920
3. Belu A.M., Davies M.C., Newton J.M., and Patel N. TOF-SIMS characterization and imaging of controlled-release drug delivery systems. Analytical Chemistry 72 22 (2000) 5625-5638
4. van der Weerd J., and Kazarian S.G. Combined approach of FTIR imaging and conventional dissolution tests applied to drug release. Journal of Controlled Release 98 2 (2004) 295-305
5. Mahoney C.M., Roberson S.V., and Gillen G. Depth profiling of 4-acetamindophenol-doped poly(lactic acid) films using cluster secondary ion mass spectrometry. Analytical Chemistry 76 11 (2004) 3199-3207
6. Biddulph G.X., Piwowar A.M., Fletcher J.S., Lockyer N.P., and Vickerman J.C. Properties of C84 and C24H12 molecular ion sources for routine TOF-SIMS analysis. Analytical Chemistry 79 19 (2007) 7259-7266
7. Chen Y.Y., Yu B.Y., Wang W.B., Hsu M.F., Lin W.C., Lin Y.C., Jou J.H., and Shyue J.J. X-ray photoelectron spectrometry depth profiling of organic thin films using C-60 sputtering. Analytical Chemistry 80 2 (2008) 501-505
8. Tanaka K., Sanada N., Hikita M., Nakamura T., Kajiyama T., and Takahara A. Surface depth analysis for fluorinated block copolymer films by X-ray photoelectron spectroscopy using C60 cluster ion beam. Applied Surface Science 254 17 (2008) 5435-5438
9. Miyayama T., Sanada N., Iida S.-i., Hammond J.S., and Suzuki M. The effect of angle of incidence to low damage sputtering of organic polymers using a C60 ion beam. Applied Surface Science 255 4 (2008) 951-953
10. Sanada N., Yamamoto A., Oiwa R., and Ohashi Y. Extremely low sputtering degradation of polytetrafluoroethylene by C-60 ion beam applied in XPS analysis. Surface and Interface Analysis 36 3 (2004) 280-282
11. Bachman B.J., and Vasile M.J. Ion bombardment of polyimide films. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 7 4 (1989) 2709-2716
12. Hwang J., Amy F., and Kahn A. Spectroscopic study on sputtered PEDOT center dot PSS: Role of surface PSS layer. Organic Electronics 7 5 (2006) 387-396
13. Shard A.G., Brewer P.J., Green F.M., and Gilmore I.S. Measurement of sputtering yields and damage in C60SIMS depth profiling of model organic materials. Surface and Interface Analysis 39 4 (2007) 294-298
14. Mahoney C.M., Yu J.X., and Gardella Jr. J.A. Depth profiling of poly(l-lactic acid)/triblock copolymer blends with time-of-flight secondary ion mass spectrometry. Analytical Chemistry 77 11 (2005) 3570-3578
15. Mahoney C.M., and Fahey A.J. Three-dimensional compositional analysis of drug eluting stent coatings using cluster secondary ion mass spectrometry. Analytical Chemistry 80 3 (2008) 624-632
16. Tanaka K., Takahara A., and Kajiyama T. Film thickness dependence of the surface structure of immiscible polystyrene/poly(methyl methacrylate) blends. Macromolecules 29 9 (1996) 3232-3239
17. Shard A.G., Green F.M., Brewer P.J., Seah M.P., and Gilmore I.S. Quantitative molecular depth profiling of organic delta-layers by C60 ion sputtering and SIMS. The Journal of Physical Chemistry B 112 9 (2008) 2596-2605
18. Beamson G.B., and D. The XPS of Polymers Database in High Resolution (2000), SurfaceSpectra Ltd.
19. Hollander A., Haupt M., and Oehr C. On depth profiling of polymers by argon ion sputtering. Plasma Processes and Polymers 4 9 (2007) 773-776
20. Zolnik B.S., and Burgess D.J. Evaluation of in vivo-in vitro release of dexamethasone from PLGA microspheres. Journal of Controlled Release 127 2 (2008) 137-145
21. Narasimhan B., and Langer R. Zero-order release of micro- and macromolecules from polymeric devices: the role of the burst effect. Journal of Controlled Release 47 1 (1997) 13-20
22. Belu A., Mahoney C., and Wormuth K. Chemical imaging of drug eluting coatings: combining surface analysis and confocal Raman microscopy. Journal of Controlled Release 126 2 (2008) 111-121