Indentation mechanics of Cu-Be quantified by an in situ transmission electron microscopy mechanical probe

Journal of Materials Research

Volumn 20, Issue 10, 2005, Pages 2726-2732

  Bobji, M S ^a   Pethica, J B ^b,c   Inkson, B J ^d  

^a INDIAN INSTITUTE OF SCIENCE   (India)

^b UNIVERSITY OF OXFORD   (United Kingdom)

^c TRINITY COLLEGE DUBLIN   (Ireland)

^d UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DEFORMATION; INDENTATION; MECHANICS; NANOSTRUCTURED MATERIALS; PROBES; SENSORS; SURFACE ROUGHNESS; TRANSMISSION ELECTRON MICROSCOPY;

FORCE SENSOR; INDENTATION MECHANICS; MECHANICAL PROBE; NANOINDENTATION;

COPPER ALLOYS;

EID: 29144482664     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2005.0332     Document Type: Article

References (14)

1. M.A. Haque and M.T.A. Saif: In situ tensile testing of nano-scale specimens in SEM and TEM. Exp. Mech. 42, 123 (2002).
2. T. Kizuka, K. Yamada, S. Deguchi, M. Naruse, and N. Tanaka: Cross-sectional time-resolved high-resolution transmission electron microscopy of atomic-scale contact and noncontact-type scannings on gold surfaces. Phys. Rev. B 55, R7398 (1997).
3. A. Erts: Lõhmus, R.Lõhmus, H. Olin, A.V. Pokropivny, L. Ryen, and K. Svensson: Force interactions and adhesion of gold contacts using a combined atomic force microscope and transmission electron microscope. Appl. Surf Sci. 188, 460 (2002).
4. M.A. Wall and U. Dahmen: An in situ nanoindentation specimen holder for a high voltage transmission electron microscope. Microsc. Res. Technol. 42, 248 (1998).
5. A.M. Minor, J.W. Morris, Jr., and E.A. Stach: Quantitative in situ nanoindentation in an electron microscope. Appl. Phys. Lett. 79, 1625 (2001).
6. M.S. Bobji, C.S. Ramanujan, R.C. Doole, J.B. Pethica, and B.J. Inkson: An in situ TEM nanoindenter system with 3-axis inertial positioner, in Mechanical Properties Derived from Nanostructuring Materials, edited by D.F. Bahr, H. Kung, N.R. Moody, and K.J. Wahl (Mater. Res. Soc. Symp. Proc. 778, Warrendale, PA, 2003), p. 105.
7. M.S. Bobji, C.S. Ramanujan, J.B. Pethica, and B.J. Inkson: Proceedings of International Congress on Electron Microscopy, Durban, 941 (2002).
8. M.S. Bobji, C.S. Ramanujan, J.B. Pethica, and B.J. Inkson: A miniaturized TEM nanoindenter for studying material deformation in situ. Meas. Sci. Technol., (submitted).
9. K.L. Johnson: Contact Mechanics (Cambridge University Press, Cambridge, U.K., 1985)
10. W.C. Oliver and G.M. Pharr: An improved technique for determining hardness and elastic modulus using load and displacement sensing indentation experiments. J. Mater. Res. 7, 1564 (1992).
11. M.F. Doerner and W.D. Nix: A method for interpreting the data from depth-sensing indentation instruments. J. Mater. Res. 1, 610 (1986).
12. K. Herrmann, N.M. Jennett, W. Wegener, J. Meneve, K. Hasche, and R. Seemann: Progress in determination of the area function of indenters used for nanoindentation. Thin Solid Films 377-378, 394 (2000).
13. M.S. Bobji and S.K. Biswas: Deconvolution of hardness from data obtained from nanoindentation of rough surfaces. J. Mater. Res. 14 2259 (1999).
14. H-J. Weiss: On deriving Vickers hardness from penetration depth. Phys. Status Solidi A99, 491 (1987).