Mapping mechanical properties on the nanoscale using atomic-force acoustic microscopy

JOM

Volumn 59, Issue 1, 2007, Pages 23-29

  Hurley, D C ^a   Kopycinska Muller M ^a   Kos, A B ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; IMAGE ANALYSIS; MECHANICAL PROPERTIES; THIN FILMS;

ATOMIC-FORCE ACOUSTIC MICROSCOPY; CONTACT RESONANCE-SPECTROSCOPY; NANOSCALE STRUCTURE;

NANOSTRUCTURED MATERIALS;

EID: 33846479528     PISSN: 10474838     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11837-007-0005-8     Document Type: Review

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