Friction of thin water films: A nanotribological study

Surface Science

Volumn 504, Issue , 2002, Pages 199-207

  Opitz, A ^a   Ahmed, S U ^a   Schaefer, J A ^a   Scherge, M ^b  

^a ILMENAU UNIVERSITY OF TECHNOLOGY   (Germany)

^b IAVF Antriebstechnik AG   (Germany)

Author keywords

Atomic force microscopy; Friction; Scanning tunneling microscopy; Silicon; Silicon oxides; Tribology; Water

Indexed keywords

ATOMIC FORCE MICROSCOPY; CAPILLARITY; DESORPTION; FRICTION; HYDROPHILICITY; SCANNING TUNNELING MICROSCOPY; SILICA; SILICON; TRIBOLOGY;

SCANNING FORCE MICROSCOPY (SFM);

THIN FILMS;

EID: 0037140054     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(02)01069-5     Document Type: Article

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