|
|
Volumn 27, Issue 3, 2007, Pages 189-196
|
|
Nanometrology: A critical discipline for the twenty-first century
[No Author Info available]
|
|
Author keywords
Calibration; Instruments; Measurement; Nanotechnology; Standards
|
|
Indexed keywords
CALIBRATION;
MEASUREMENT THEORY;
NANOSTRUCTURED MATERIALS;
STANDARDS;
NANOMETROLOGY;
NANOMETROLOGY DEVELOPMENT;
NANOTECHNOLOGY;
|
|
EID: 34250687453
PISSN: 02602288
EISSN: None
Source Type: Journal
DOI: 10.1108/02602280710758110 Document Type: Article |
|
Times cited : (12)
|
|
References (0)
|