Computer image processing of transmission electron micrograph pictures as a fast and reliable tool to analyze the size of nanoparticles

Journal of Physical Chemistry B

Volumn 104, Issue 37, 2000, Pages 8779-8781

  Reetz, Manfred T ^a   Maase, Matthias ^a   Schilling, Tobias ^a   Tesche, Bernd ^a  

^a MAX PLANCK INSTITUT FÜR KOHLENFORSCHUNG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COLLOIDS; IMAGE ANALYSIS; IMAGE RECONSTRUCTION; OBJECT RECOGNITION; OXIDES; PALLADIUM; PARTICLE SIZE ANALYSIS; PARTICLES (PARTICULATE MATTER); TRANSMISSION ELECTRON MICROSCOPY;

COLLOIDAL PARTICLE DIAMETER; NANOPARTICLE;

NANOSTRUCTURED MATERIALS;

EID: 0034270293     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp000328e     Document Type: Article

References (49)

1. See for example: (a) Schmid, G., Ed. Clusters and Colloids: From Theory to Applications; VCH: Weinheim, 1994.
2. (b) Fendler, J. H., Ed. Nanoparticles and Nanostructured Films; Wiley-VCH: Weinheim, 1998.
3. Schön, G.; Simon, U. Colloid Polym. Sci. 1995, 273, 101.
4. Meguro, K.; Torizuka, M.; Esumi, K. Bull. Chem. Soc. Jpn. 1988, 61, 341.
5. (e) Pileni, M. P. Ber. Bunsen-Ges. 1997, 101, 1578.
6. (f) Watzky, M. A.; Finke, R. G. J. Am. Chem. Soc. 1997, 119, 10382.
7. (g) Brus, L. Curr. Opin. Colloid Interface Sci. 1996, 2, 197.
8. (h) Antonietti, M.; Gröhn, F.; Hartmann, J.; Bronstein, L. Angew. Chem. 1997, 109, 2170;
9. Angew. Chem., Int. Ed. Engl. 1997, 36, 2080.
10. Schmid, G.; Bäumle, M.; Geerkens, M.; Heim, I.; Osemann, C.; Sawitowski, T. Chem. Soc. Rev. 1999, 28, 179.
11. (j) Teranishi, T.; Miyake, M. Chem. Mater. 1998, 10, 594.
12. (k) Ahmadi, T. S.; Wang, Z. L.; Green, T. C.; Henglein, A.; El-Sayed, M. A. Science (Washington, D.C.) 1996, 272, 1924.
13. Yu, W.; Liu, H. Chem. Mater. 1998, 10, 1205.
14. Zhong, C. J.; Zhang, W. X.; Leibowitz, F. L.; Eichelberger, H. H. Chem. Commun. (Cambridge) 1999, 1211.
15. (n) Grunwaldt, J.-D.; Kiener, C.; Wögerbauer, C.; Baiker, A. J. Catal. 1999, 181, 223.
16. (o) Busser, G. W.; van Ommen, J. G.; Lercher, J. A. J. Phys. Chem. B 1999, 103, 1651.
17. (p) Liz-Marzan, L. M.; Giersig, M.; Mulvaney, P. Langmuir 1996, 12, 4329.
18. (q) Toshima, N.; Wang, Y. Langmuir 1994, 10, 4574.
19. (r) Giroir-Fendler, A.; Richard, D.; Gallezot, P. Faraday Discuss. 1991, 92, 69.
20. Examples of metal oxide colloids: (a) Lume-Pereira, C.; Baral, S.; Henglein, A.; Janata, E. J. Phys. Chem. 1985, 89, 5772.
21. (b) Harriman, A.; Thomas, J. M.; Millward, G. R. New J. Chem. 1987, 11, 757.
22. Kalyanasundaram, K.; Grätzel, M. Angew. Chem. 1979, 91, 759;
23. Angew. Chem., Int. Ed. Engl. 1979, 18, 701.
24. Christensen, P. A.; Harriman, A.; Porter, G.; Neta, P. J. Chem. Soc., Faraday Trans. 2 1984, 80, 1451.
25. (e) Claerbout, A.; Nagy, J. B. In Preparation of Catalysts V; Poncelet, G., Ed.; Studies in Surface Science and Catalysis Vol. 63; Elsevier: Amsterdam, 1991; p 705.
26. (f) Pileni, M. P. Langmuir 1997, 13, 3266.
27. (g) Reetz, M. T.; Quaiser, S. A.; Winter, M.; Becker, J. A.; Schäfer, R.; Slimming, U.; Marmann, A.; Vogel, R.; Konno, T. Angew. Chem. 1996, 108, 2228; Angew. Chem., Int. Ed. Engl. 1996, 35, 2092.
28. (h) Reetz, M. T.; Koch, M. G. J. Am. Chem. Soc. 1999, 121, 7933. Examples of metal sulfide colloids:
29. Weller, H.; Eychmüller, A. In Semiconductor Nanoclusters: Physical, Chemical, and Catalytic Aspects; Kamat, P. V., Meisel, D., Eds.; Studies in Surface Science and Catalysis Vol. 103; Elsevier: Amsterdam, 1997; p 5.
30. (j) Weller, H. Angew. Chem. 1993, 105, 43; Angew. Chem., Int. Ed. Engl. 1993, 32, 41.
31. (k) Henglein, A. Ber. Bunsen-Ges. 1997, 101, 1562.
32. Feltin, N.; Levy, L.; Ingert, D.; Pileni, M.-P. Adv. Mater. (Weinheim, Ger). 1999, 11, 398.
33. Kamat, P. V.; Meisel. D. Semiconductor Nanoclusters: Physical, Chemical and Catalytic Aspects; Elsevier: Amsterdam, 1997.
34. (a) Kirkland, E. J. Advanced Computing in Electron Microscopy; Plenum Press: New York, 1998.
35. (b) Cowley, J. M. Prog. Surf. Sci. 1986, 27, 209.
36. Thomas, G. Ultramicroscopy 1986, 20, 239.
37. Seeger, A. J. Electron. Microsc. 1999, 48, 301.
38. (e) Niemantsverdriet, J. W. Spectroscopy in Catalysis; VCH: Weinheim, 1993.
39. Duff, D. G.; Edwards, P. P.; Johnson, B. F. G. J. Phys. Chem. 1995, 99, 15934.
40. Image Science Software GmbH, Heilbronner Str. 10, D-10711 Berlin, Germany.
41. (a) Serysheva, I. I.; Orlova, E. V.; Chiu, W.; Sherman, M. B.; Hamilton, S. L.; van Heel, M. Nat. Struct. Biol. 1995, 2, 18.
42. (b) Schatz, M.; Orlova, E. V.; Dube, P.; Jäger, J.; van Heel, M. J. Struct. Biol. 1995, 114, 28.
43. van Heel, M.; Harauz, G.; Orlova, E. V. J. Struct. Biol. 1996, 116, 17.
44. It can be obtained from the authors.
45. Barrier of the grayscale below that pixels are regarded as potential part of an object.
46. (a) Reetz, M. T.; Maase, M. Adv. Mater. (Weinheim. Ger.) 1999, 11, 773. See also:
47. (b) Reetz, M. T.; Helbig, W.; Quaiser, S. A.; Slimming, U.; Breuer, N.; Vogel, R. Science (Washington, D.C.) 1995, 267, 367.
48. ModuI-MORFO requires the objects to be bright and the background to be dark.
49. If the quality of the TEM image is reasonable an operator needs only one or two runs to achieve maximum agreement between the original and processed image.