메뉴 건너뛰기




Volumn 2, Issue 3-4, 2009, Pages 227-242

A review of silicon carbide development in MEMS applications

Author keywords

Deposition; Devices; Fabrication; MEMS; Microelectromechanical systems; Prospect; Review; SiC; Silicon carbide

Indexed keywords

COST EFFECTIVENESS; DEPOSITION; FABRICATION; MEMS; MICROELECTROMECHANICAL DEVICES; REVIEWS;

EID: 68849112428     PISSN: 17533465     EISSN: 17533473     Source Type: Journal    
DOI: 10.1504/IJCMSSE.2009.027484     Document Type: Review
Times cited : (85)

References (62)
  • 1
    • 3042704176 scopus 로고    scopus 로고
    • Tribological impact of SiC encapsulation of released polycrystalline silicon microstructures
    • Ashurst, W.R., Wijesundara, M.B.J., Carraro, C. and Maboudian, R. (2004) 'Tribological impact of SiC encapsulation of released polycrystalline silicon microstructures', Tribology Letters, Vol. 17, p.195.
    • (2004) Tribology Letters , vol.17 , pp. 195
    • Ashurst, W.R.1    Wijesundara, M.B.J.2    Carraro, C.3    Maboudian, R.4
  • 2
    • 0037445348 scopus 로고    scopus 로고
    • Simulation, fabrication and testing of bulk micromachined 6H-SiC high-g piezoresistive accelerometers
    • Atwell, A.R., Okojie, R.S., Kornegay, K.T., Roberson, S.L. and Beliveau, A. (2003) 'Simulation, fabrication and testing of bulk micromachined 6H-SiC high-g piezoresistive accelerometers', Sensors and Actuators A, Vol. 104, p.11.
    • (2003) Sensors and Actuators A , vol.104 , pp. 11
    • Atwell, A.R.1    Okojie, R.S.2    Kornegay, K.T.3    Roberson, S.L.4    Beliveau, A.5
  • 3
    • 68849093978 scopus 로고    scopus 로고
    • Baranzahi, A., Tobias, P., Spetz, A.L., Lundström, I., Mårtensson, P., Glavmo, M., Göras, A., Nytomt, J., Salomonsson, P. and Larsson, H. (1997) 'Combustion and emission formation in SI engines', SAE Technical Paper Series 972940, p.231.
    • Baranzahi, A., Tobias, P., Spetz, A.L., Lundström, I., Mårtensson, P., Glavmo, M., Göras, A., Nytomt, J., Salomonsson, P. and Larsson, H. (1997) 'Combustion and emission formation in SI engines', SAE Technical Paper Series 972940, p.231.
  • 4
    • 0035852224 scopus 로고    scopus 로고
    • Focused ion beam sputtering investigations on SiC
    • Bischoff, L., Teichert, J. and Heera, V. (2001) 'Focused ion beam sputtering investigations on SiC', Applied Surface Science, Vol. 184, p.372.
    • (2001) Applied Surface Science , vol.184 , pp. 372
    • Bischoff, L.1    Teichert, J.2    Heera, V.3
  • 5
    • 0034528924 scopus 로고    scopus 로고
    • High vacuum chemical vapour deposition of cubic SiC thin films on Si (001) substrates using single source precursor
    • Boo, J.H., Lee, S.B., Yu, K.S., Sung, M.M. and Kim, Y. (2000) 'High vacuum chemical vapour deposition of cubic SiC thin films on Si (001) substrates using single source precursor', Surface Coatings Technology, Vol. 131, p.147.
    • (2000) Surface Coatings Technology , vol.131 , pp. 147
    • Boo, J.H.1    Lee, S.B.2    Yu, K.S.3    Sung, M.M.4    Kim, Y.5
  • 6
    • 33744740194 scopus 로고    scopus 로고
    • Formation of SiC SOI structures by direct growth on insulating layers
    • Chen, J., Scofield, J. and Steckl, A.J. (2000) 'Formation of SiC SOI structures by direct growth on insulating layers', Journal of Electrochemical Society, Vol. 147, p.3845.
    • (2000) Journal of Electrochemical Society , vol.147 , pp. 3845
    • Chen, J.1    Scofield, J.2    Steckl, A.J.3
  • 9
    • 0037197294 scopus 로고    scopus 로고
    • Comparison of porous silicon, porous polysilicon and porous silicon carbide as materials for humidity sensing applications
    • Connolly, E.J., O'Halloran, G.M., Pham, H.T.M., Sarro, P.M. and French, P.J. (2002) 'Comparison of porous silicon, porous polysilicon and porous silicon carbide as materials for humidity sensing applications', Sensors and Actuators A, Vol. 99, p.25.
    • (2002) Sensors and Actuators A , vol.99 , pp. 25
    • Connolly, E.J.1    O'Halloran, G.M.2    Pham, H.T.M.3    Sarro, P.M.4    French, P.J.5
  • 10
    • 0141573528 scopus 로고    scopus 로고
    • Femtosecond pulsed laser micromachining of single crystalline 3C-SiC structures based on a laser-induced defect-activation process
    • Dong, Y., Zorman, C. and Molian, P. (2003) 'Femtosecond pulsed laser micromachining of single crystalline 3C-SiC structures based on a laser-induced defect-activation process', Journal of Micromechanics and Microengineering, Vol. 13, p.680.
    • (2003) Journal of Micromechanics and Microengineering , vol.13 , pp. 680
    • Dong, Y.1    Zorman, C.2    Molian, P.3
  • 13
    • 33744919845 scopus 로고    scopus 로고
    • Polycrystalline silicon carbide as a substrate material for reducing adhesion in MEMS
    • Gao, D., Carraro, C., Howe, R.T. and Maboudian, R. (2006) 'Polycrystalline silicon carbide as a substrate material for reducing adhesion in MEMS', Tribology Letters, Vol. 21, p.226.
    • (2006) Tribology Letters , vol.21 , pp. 226
    • Gao, D.1    Carraro, C.2    Howe, R.T.3    Maboudian, R.4
  • 14
    • 68849128619 scopus 로고    scopus 로고
    • Hensler, R. (2002) Research Report #GB270, MEMS Technology: Where to Business Communications Co. (bbcresearch.com).
    • Hensler, R. (2002) Research Report #GB270, MEMS Technology: Where to Business Communications Co. (bbcresearch.com).
  • 15
    • 17944395147 scopus 로고    scopus 로고
    • Residual stress and texture in poly-SiC films grown by low-pressure organometallic chemical-vapor deposition
    • Hurtos, E. and Rodriguez-Viejo, J. (2000) 'Residual stress and texture in poly-SiC films grown by low-pressure organometallic chemical-vapor deposition', Journal of Applied Physics, Vol. 87, p.1748.
    • (2000) Journal of Applied Physics , vol.87 , pp. 1748
    • Hurtos, E.1    Rodriguez-Viejo, J.2
  • 21
    • 0035275417 scopus 로고    scopus 로고
    • Etching of silicon carbide for device fabrication and through via-hole formation
    • Khan, F.A., Roof, B., Zhou, L. and Adesida, I. (2001) 'Etching of silicon carbide for device fabrication and through via-hole formation', Journal of Electronic Materials, Vol. 30, p.212.
    • (2001) Journal of Electronic Materials , vol.30 , pp. 212
    • Khan, F.A.1    Roof, B.2    Zhou, L.3    Adesida, I.4
  • 24
    • 0035388473 scopus 로고    scopus 로고
    • Effect of microstructure of SiC layer on the indentation properties of silicon carbide-graphite system fabricated by LPCVD method
    • Lee, K.S., Park, J.Y., Kim, W.J. and Hong, G.W. (2001) 'Effect of microstructure of SiC layer on the indentation properties of silicon carbide-graphite system fabricated by LPCVD method', Journal of Materials Science Letters, Vol. 20, p.1229.
    • (2001) Journal of Materials Science Letters , vol.20 , pp. 1229
    • Lee, K.S.1    Park, J.Y.2    Kim, W.J.3    Hong, G.W.4
  • 26
    • 0033361372 scopus 로고    scopus 로고
    • SiC MEMS: Opportunities and challenges for applications in harsh environments
    • Vols
    • Mehregany, M. and Zorman, C.A. (1999) 'SiC MEMS: Opportunities and challenges for applications in harsh environments', Thin Solid Films Vols.355-356, p.518.
    • (1999) Thin Solid Films , vol.355-356 , pp. 518
    • Mehregany, M.1    Zorman, C.A.2
  • 27
    • 0030846945 scopus 로고    scopus 로고
    • Internal stress and elastic modulus measurements on micromachined 3C-SiC thin films
    • Mehregany, M., Tong, L., Matus, L. and Larkin, D. (1997) 'Internal stress and elastic modulus measurements on micromachined 3C-SiC thin films', IEEE Transactions on Electron Devices, Vol. 44, p.74.
    • (1997) IEEE Transactions on Electron Devices , vol.44 , pp. 74
    • Mehregany, M.1    Tong, L.2    Matus, L.3    Larkin, D.4
  • 28
    • 8644280079 scopus 로고    scopus 로고
    • Examination of bulge test for determining residual stress, Young's Modulus and Poisson's ratio of 3C-SiC thin films'
    • Mitchell, J.S., Zorman, C.A., Kicher, T., Roy, S. and Mehregany, M. (2003) 'Examination of bulge test for determining residual stress, Young's Modulus and Poisson's ratio of 3C-SiC thin films', Journal of Aerospace Engineering, Vol. 16, p.46.
    • (2003) Journal of Aerospace Engineering , vol.16 , pp. 46
    • Mitchell, J.S.1    Zorman, C.A.2    Kicher, T.3    Roy, S.4    Mehregany, M.5
  • 31
    • 33747502586 scopus 로고
    • Production of large-area single-crystal wafers of cubic SIC for semiconductor devices
    • Nishino, S., Powell, J.A. and Will, H.A. (1983) 'Production of large-area single-crystal wafers of cubic SIC for semiconductor devices', Applied Physics Letters, Vol. 42, p.460.
    • (1983) Applied Physics Letters , vol.42 , pp. 460
    • Nishino, S.1    Powell, J.A.2    Will, H.A.3
  • 33
  • 41
    • 0032473232 scopus 로고    scopus 로고
    • Performance of 3C-SiC thin films as protective coatings for silicon-micromachined atomizers
    • Rajan, N., Zorman, C.A., Mehregany, M., DeAnna, R. and Harvey, R. (1998) 'Performance of 3C-SiC thin films as protective coatings for silicon-micromachined atomizers', Thin Solid Films, Vol. 315, p.170.
    • (1998) Thin Solid Films , vol.315 , pp. 170
    • Rajan, N.1    Zorman, C.A.2    Mehregany, M.3    DeAnna, R.4    Harvey, R.5
  • 42
    • 33846113316 scopus 로고    scopus 로고
    • Stress control of polycrystalline 3C-SiC films in a large-scale LPCVD reactor using 1,3-disilabutane and dichlorosilane as precursors
    • Roper, C.S., Howe, R.T. and Maboudian, R. (2006) 'Stress control of polycrystalline 3C-SiC films in a large-scale LPCVD reactor using 1,3-disilabutane and dichlorosilane as precursors', Journal of Micromechanics and Microengineering, Vol. 16, p.2736.
    • (2006) Journal of Micromechanics and Microengineering , vol.16 , pp. 2736
    • Roper, C.S.1    Howe, R.T.2    Maboudian, R.3
  • 44
    • 0042284297 scopus 로고    scopus 로고
    • Low-stress PECVD SiC thin films for IC-compatible microstructures
    • Sarro, P., deBoer, C.R., Korkmaz, E. and Laros, J.M.W. (1998) 'Low-stress PECVD SiC thin films for IC-compatible microstructures', Sensors and Actuator A, Vol. 67, p.175.
    • (1998) Sensors and Actuator A , vol.67 , pp. 175
    • Sarro, P.1    deBoer, C.R.2    Korkmaz, E.3    Laros, J.M.W.4
  • 45
    • 0033750798 scopus 로고    scopus 로고
    • Silicon carbide as a new MEMS technology
    • Sarro, P.M. (2000) 'Silicon carbide as a new MEMS technology', Sensors and Actuators A, Vol. 82, p.210.
    • (2000) Sensors and Actuators A , vol.82 , pp. 210
    • Sarro, P.M.1
  • 47
    • 0033897055 scopus 로고    scopus 로고
    • Material issues in microelectromechanical systems (MEMS)
    • Spearing, S.M. (2000) 'Material issues in microelectromechanical systems (MEMS)', Acta Materialia, Vol. 48, p.179.
    • (2000) Acta Materialia , vol.48 , pp. 179
    • Spearing, S.M.1
  • 49
    • 0035898368 scopus 로고    scopus 로고
    • Micromechanical properties of silicon-carbide thin films deposited using single-source chemical-vapor deposition
    • Stoldt, C.R., Fritz, M.C., Carraro, C. and Maboudian, R. (2001) 'Micromechanical properties of silicon-carbide thin films deposited using single-source chemical-vapor deposition', Applied Physics Letters, Vol. 79, pp.347-349.
    • (2001) Applied Physics Letters , vol.79 , pp. 347-349
    • Stoldt, C.R.1    Fritz, M.C.2    Carraro, C.3    Maboudian, R.4
  • 51
    • 0032523974 scopus 로고    scopus 로고
    • Micro/nanotribological studies of polysilicon and SiC films for MEMS applications
    • Sundararajan, S. (1998) 'Micro/nanotribological studies of polysilicon and SiC films for MEMS applications', Wear, Vol. 217, p.251.
    • (1998) Wear , vol.217 , pp. 251
    • Sundararajan, S.1
  • 52
    • 0036850896 scopus 로고    scopus 로고
    • Nitrogen doping of polycrystalline 3C-SiC films grown by single-source chemical vapor deposition
    • Wijesundara, M.B.J., Stoldt, C.R., Carraro, C., Howe, R.T. and Maboudian, R. (2002) 'Nitrogen doping of polycrystalline 3C-SiC films grown by single-source chemical vapor deposition', Thin Solid Films Vol. 419, p.69.
    • (2002) Thin Solid Films , vol.419 , pp. 69
    • Wijesundara, M.B.J.1    Stoldt, C.R.2    Carraro, C.3    Howe, R.T.4    Maboudian, R.5
  • 53
    • 0003196681 scopus 로고    scopus 로고
    • Special issue on integrated sensors, microactuators and microsystems (MEMS)
    • Wise, K.D. (1998) 'Special issue on integrated sensors, microactuators and microsystems (MEMS)', Proceedings of the IEEE, Vol. 86, p.1531.
    • (1998) Proceedings of the IEEE , vol.86 , pp. 1531
    • Wise, K.D.1
  • 54
    • 33645213339 scopus 로고    scopus 로고
    • Fabrication and testing of bulk micromachined silicon carbide piezoresistive pressure sensors for high temperature applications
    • Wu, C.H., Zorman, C.A. and Mehregany, M. (2006) 'Fabrication and testing of bulk micromachined silicon carbide piezoresistive pressure sensors for high temperature applications', IEEE Sensors Journal, Vol. 6, p.316.
    • (2006) IEEE Sensors Journal , vol.6 , pp. 316
    • Wu, C.H.1    Zorman, C.A.2    Mehregany, M.3
  • 55
    • 21544464120 scopus 로고
    • Low damage and residue-free dry etching of 6H-SiC using electron cyclotron resonance plasma
    • Xie, K., Femish, J.R., Zhao, J.H., Buchwald, W.R. and Cacas, L. (1995) 'Low damage and residue-free dry etching of 6H-SiC using electron cyclotron resonance plasma', Applied Physics Letters, Vol. 67, p.368.
    • (1995) Applied Physics Letters , vol.67 , pp. 368
    • Xie, K.1    Femish, J.R.2    Zhao, J.H.3    Buchwald, W.R.4    Cacas, L.5
  • 57
    • 0033902750 scopus 로고    scopus 로고
    • Fabrication and testing of surface micromachined polycrystalline SiC micromotors
    • Yasseen, A.A., Wu, C.H., Zorman, C.A. and Mehregany, M. (2000) 'Fabrication and testing of surface micromachined polycrystalline SiC micromotors', IEEE Electron Device Letters, Vol. 21, p.164.
    • (2000) IEEE Electron Device Letters , vol.21 , pp. 164
    • Yasseen, A.A.1    Wu, C.H.2    Zorman, C.A.3    Mehregany, M.4
  • 60
    • 36449003431 scopus 로고
    • Epitaxial growth of 3C-SiC films on 4 in diam (100) silicon wafers by atmospheric pressure chemical vapor deposition
    • Zorman, C.A., Fleischman, A.J., Dewa, A.S., Mehregany, M., Jacob, C., Nishino, S. and Pirouz, P. (1995) 'Epitaxial growth of 3C-SiC films on 4 in diam (100) silicon wafers by atmospheric pressure chemical vapor deposition', Journal of Applied Physics, Vol. 78, p.5136.
    • (1995) Journal of Applied Physics , vol.78 , pp. 5136
    • Zorman, C.A.1    Fleischman, A.J.2    Dewa, A.S.3    Mehregany, M.4    Jacob, C.5    Nishino, S.6    Pirouz, P.7


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.