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Volumn 78, Issue 2, 2001, Pages 162-164

Monocrystalline silicon carbide nanoelectromechanical systems

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001352045     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1338959     Document Type: Article
Times cited : (274)

References (17)
  • 9
  • 10
    • 0033080270 scopus 로고    scopus 로고
    • A. N. Cleland and M. L. Roukes, Appl. Phys. Lett. 69, 2653 (1996); A. N. Cleland and M. L. Roukes, Sens. Actuators 72, 256 (1999).
    • (1999) Sens. Actuators , vol.72 , pp. 256
    • Cleland, A.N.1    Roukes, M.L.2
  • 12
    • 0348120629 scopus 로고    scopus 로고
    • note
    • The correction factor K primarily reflects mass loading from the metallic electrode. Using values from the literature for Young's modulus of the electrode materials we deduce that the additional stiffness introduced is completely negligible.
  • 13
    • 0348120630 scopus 로고    scopus 로고
    • note
    • Electrodes were comprised of either Au or Al, with typical thickness ranging from 50 to 80 nm.
  • 14
    • 0003562619 scopus 로고
    • Robert E. Krieger, Malabar, FL, Chaps. 6 and 7
    • 12) for cubic crystal. See, e.g., B. A. Auld, Acoustic Fields and Waves in Solids, 2nd ed. (Robert E. Krieger, Malabar, FL, 1990), Vol. 1, Chaps. 6 and 7.
    • (1990) Acoustic Fields and Waves in Solids, 2nd Ed. , vol.1
    • Auld, B.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.