SCOPUS 정보 검색 플랫폼

Journal of Physics Condensed Matter

Volumn 13, Issue 40, 2001, Pages 8989-8999

The influence of high energy proton bombardment on the electrical and defect properties of single-crystal ZnO

(6) Auret, F D a Goodman, S A a Hayes, M a Legodi, M J a Van Laarhoven, H A a Look, D C b,c

a UNIVERSITY OF PRETORIA (South Africa)

b WRIGHT STATE UNIVERSITY (United States)

c AIR FORCE RESEARCH LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; CRYSTAL DEFECTS; ELECTRIC PROPERTIES; ELECTRON TRAPS; GALLIUM NITRIDE; ION BOMBARDMENT; IRRADIATION; LEAKAGE CURRENTS; SCHOTTKY BARRIER DIODES; SINGLE CRYSTALS;

HIGH ENERGY PROTON BOMBARDMENT; REVERSE LEAKAGE CURRENT; WURZITIC SEMICONDUCTOR MATERIAL;

ZINC OXIDE;

EID: 0035828725 PISSN: 09538984 EISSN: None Source Type: Journal
DOI: 10.1088/0953-8984/13/40/315 Document Type: Article

Times cited : (59)

References (23)

1
- 0035932264
- (2001) Mater. Sci. Eng. B , vol.80 , pp. 383
- Look, D.C.¹

2
- 0025418087
- (1990) Sensors Actuators A , vol.21-23 , pp. 1027
- Vellekoop, M.J.¹ Visser, C.C.G.² Sarro, P.M.³ Venema, A.⁴

3
- 0016081559
- (1974) J. Appl. Phys. , vol.45 , pp. 3023
- Lang, D.V.¹

4
- 0016647677
- (1975) J. Appl. Phys. , vol.46 , pp. 5173
- Vincent, G.¹ Bois, D.² Pinard, P.³

5
- 0003004923
- private communication
- (2000)
- Stutz, C.E.¹

6
- 0030233648
- (1996) Japan. J. Appl. Phys. , vol.35
- Lee, W.-I.¹ Young, R.-L.² Chen, W.-K.³

7
- 0003076183
- (1990) Japan. J. Appl. Phys. , vol.29 , pp. 1426
- Kanai, Y.¹

8
- 0001342972
- (1988) J. Appl. Phys. , vol.63 , pp. 5375
- Rohatgi, A.¹ Pang, S.K.² Gupa, T.K.³ Straub, W.D.⁴

9
- 7044232968
- (1988) J. Appl. Phys. , vol.63 , pp. 1781
- Simpson, J.C.¹ Cordaro, J.F.²

10
- 83455169491
- (1980) Japan. J. Appl. Phys. , vol.19 , pp. 1793
- Shohata, N.¹ Matsumura, T.² Ohno, T.³

11
- 84917855091
- (1980) Japan. J. Appl. Phys. , vol.19
- Nitayama, A.¹ Sakaki, H.² Ikoma, T.³

12
- 0026137471
- (1991) Japan. J. Appl. Phys. , vol.30 , pp. 703
- Kanai, Y.¹

13
- 0026223999
- (1991) Japan. J. Appl. Phys. , vol.30 , pp. 2021
- Kanai, Y.¹

14
- 0001379015
- (1999) Appl. Phys. Lett. , vol.75 , pp. 811
- Look, D.C.¹ Reynolds, D.C.² Hemsky, J.W.³ Jones, R.L.⁴ Sizelove, J.R.⁵

15
- 0001422561
- (1998) Appl. Phys. Lett. , vol.72 , pp. 2277
- Fang, Z.-Q.¹ Look, D.C.² Kim, W.³ Fan, Z.⁴ Botchkarev, A.⁵ Morkoc, H.⁶

16
- 0004350459
- submitted
- (2001) Appl. Phys. Lett.
- Goodman, S.A.¹ Auret, F.D.² Legodi, M.J.³ Gibart, P.⁴ Beaumont, B.⁵

17
- 0000616103
- (1999) Mater. Sci. Eng. B , vol.61-62 , pp. 378
- Hallen, A.¹ Henry, A.² Pellegrino, P.³ Svensson, B.G.⁴ Åberg, D.⁵

18
- 0001686108
- (1999) Appl. Phys. Lett. , vol.74 , pp. 407
- Auret, F.D.¹ Goodman, S.A.² Koschnick, F.K.³ Spaeth, J.-M.⁴ Beaumont, B.⁵ Gibart, P.⁶

19
- 0000579163
- (1998) Appl. Phys. Lett. , vol.73 , pp. 3745
- Auret, F.D.¹ Goodman, S.A.² Koschnick, F.K.³ Spaeth, J.-M.⁴ Beaumont, B.⁵ Gibart, P.⁶

20
- 0031994210
- (1998) Solid State Commun. , vol.105 , pp. 399
- Look, D.C.¹ Reynolds, D.C.² Sizelove, J.R.³ Jones, R.L.⁴ Litton, C.W.⁵ Cantwell, G.⁶ Harsch, W.C.⁷

21
- 0004350459
- submitted
- (2001) Appl. Phys. Lett.
- Auret, F.D.¹ Goodman, S.A.² Legodi, M.J.³ Van Laarhofen, H.A.⁴ Look, D.C.⁵

22
- 0001372866
- (1939) Phys. Rev. , vol.54 , pp. 657
- Frenkel, J.¹

23
- 0020765523
- (1983) Solid-State Electron. , vol.26 , pp. 539
- Troxell, J.R.¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.