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Volumn 308-310, Issue , 2001, Pages 899-903

Defect analysis and engineering in ZnO

Author keywords

Doping; Hydrogen; Native defects; ZnO

Indexed keywords

BAND STRUCTURE; CRYSTAL DEFECTS; CRYSTAL IMPURITIES; ELECTRIC CONDUCTIVITY; HYDROGEN; OPTOELECTRONIC DEVICES; PARAMAGNETIC RESONANCE; PROBABILITY DENSITY FUNCTION; SEMICONDUCTOR DOPING;

EID: 0035670824     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(01)00830-4     Document Type: Article
Times cited : (253)

References (33)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.