Near field optics and magnetism

Materials Science Forum

Volumn 302-303, Issue , 1999, Pages 105-114

  Souche, Y ^a   Schlenker, M ^a   Raphel, R ^a   Alvarez Prado, L ^a  

^a LABORATOIRE DE CRISTALLOGRAPHIE   (France)

Author keywords

Domains; Local probe; Magneto optics; Microscopy; Rayleigh criterion

Indexed keywords

EID: 0006722718     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.302-303.105     Document Type: Article

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