Benchmarking of scaled InGaAs implant-free NanoMOSFETs

IEEE Transactions on Electron Devices

Volumn 55, Issue 9, 2008, Pages 2297-2306

  Kalna, Karol ^a   Seoane, Natalia ^b   García Loureiro, Antonio J ^b   Thayne, Iain G ^a   Asenov, Asen ^a  

^a UNIVERSITY OF GLASGOW   (United Kingdom)

^b UNIVERSITY OF SANTIAGO DE COMPOSTELA   (Spain)

Author keywords

InGaAs MOSFETs; Monte Carlo (MC) simulations; Performance; Thin body architecture; Variability

Indexed keywords

INGAAS MOSFETS; MONTE CARLO (MC) SIMULATIONS; PERFORMANCE; THIN-BODY ARCHITECTURE; VARIABILITY;

EID: 50549093558     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2008.927658     Document Type: Article

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