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Volumn , Issue , 2007, Pages 109-112

Simulation of electron transport in high-mobility MOSFETs: Density of states bottleneck and source starvation

Author keywords

[No Author keywords available]

Indexed keywords

BALLISTICS; CARRIER CONCENTRATION; CIVIL AVIATION; CONCENTRATION (PROCESS); ELECTRON DEVICES; ELECTRONS; MOSFET DEVICES; OPTICAL RESOLVING POWER; OPTIMIZATION; SEMICONDUCTING INDIUM; THRESHOLD CURRENT DENSITY;

EID: 50249185663     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.2007.4418876     Document Type: Conference Paper
Times cited : (105)

References (8)
  • 1
    • 0035364878 scopus 로고    scopus 로고
    • On the mobility versus drain current relation for nanoscale MOSFETs
    • M. Lundstrom, "On the mobility versus drain current relation for nanoscale MOSFETs", Electron Dev. Lett., vol. 22, no. 6, pp. 293-295, 2001.
    • (2001) Electron Dev. Lett , vol.22 , Issue.6 , pp. 293-295
    • Lundstrom, M.1
  • 2
    • 0000241888 scopus 로고
    • Band-structure-dependent transport and impact ionization in GaAs
    • H. Shichijo and K. Hess, "Band-structure-dependent transport and impact ionization in GaAs", Phys. Rev. B vol. 23, no. 8, pp. 4197-4207 (1981).
    • (1981) Phys. Rev. B , vol.23 , Issue.8 , pp. 4197-4207
    • Shichijo, H.1    Hess, K.2
  • 3
    • 0035717885 scopus 로고    scopus 로고
    • The ballistic FET: Design, capacitance and speed limit
    • P. M. Solomon and S. E. Laux, 'The ballistic FET: design, capacitance and speed limit", IEDM, pp. 95-98, 2001.
    • (2001) IEDM , pp. 95-98
    • Solomon, P.M.1    Laux, S.E.2
  • 4
    • 0026121721 scopus 로고
    • Monte Carlo simulation of transport in technologically significant semiconductors of the diamond and zinc-blende structures. II. Submicrometer MOSFETs
    • M. V. Fischetti and S. E. Laux, "Monte Carlo simulation of transport in technologically significant semiconductors of the diamond and zinc-blende structures. II. Submicrometer MOSFETs", IEEE Trans. Elec. Dev., vol. 39, no. 3, pp. 650-660, 1991.
    • (1991) IEEE Trans. Elec. Dev , vol.39 , Issue.3 , pp. 650-660
    • Fischetti, M.V.1    Laux, S.E.2
  • 5
    • 35949009958 scopus 로고
    • Monte Carlo analysis of electron transport in small semiconductor devices including band-structure and space-charge effects
    • M. V. Fischetti and S. E. Laux, "Monte Carlo analysis of electron transport in small semiconductor devices including band-structure and space-charge effects", Phys. Rev. B, vol. 38, no. 14, pp. 9721-9745, 1988.
    • (1988) Phys. Rev. B , vol.38 , Issue.14 , pp. 9721-9745
    • Fischetti, M.V.1    Laux, S.E.2
  • 6
    • 41749110294 scopus 로고    scopus 로고
    • Theoretical Study of Some Physical Aspects of Electronic Transport in nMOSFETs at the 10 nm Gate-Length
    • M. V. Fischetti, T. O'Regan, S. Narayanan, C. Sachs, S. Jin, J. Kim, and Y. Zhang, "Theoretical Study of Some Physical Aspects of Electronic Transport in nMOSFETs at the 10 nm Gate-Length", IEEE Trans. Elec. Dev., vol. 54, no. 9, pp. 2116-2136, 2007.
    • (2007) IEEE Trans. Elec. Dev , vol.54 , Issue.9 , pp. 2116-2136
    • Fischetti, M.V.1    O'Regan, T.2    Narayanan, S.3    Sachs, C.4    Jin, S.5    Kim, J.6    Zhang, Y.7
  • 7
    • 0036253371 scopus 로고    scopus 로고
    • Essential physics of carrier transport in nanoscale MOSFETs
    • M. Lundstrom and Z. Ren, "Essential physics of carrier transport in nanoscale MOSFETs", IEEE Trans. Elec. Dev., vol. 49, no. 1, pp. 133-141, 2002.
    • (2002) IEEE Trans. Elec. Dev , vol.49 , Issue.1 , pp. 133-141
    • Lundstrom, M.1    Ren, Z.2
  • 8
    • 85056911965 scopus 로고
    • Monte Carlo Simulation of a 30 nm Dual-Gate MOSFET: How Short Can Si Go?
    • D. J. Frank, S. E. Laux and M. V. Fischetti, "Monte Carlo Simulation of a 30 nm Dual-Gate MOSFET: How Short Can Si Go?", IEDM, pp. 553-556, 1992.
    • (1992) IEDM , pp. 553-556
    • Frank, D.J.1    Laux, S.E.2    Fischetti, M.V.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.