-
1
-
-
0035423475
-
Ultra-short 25-nm-gate lattice-matched InAlAs/ InGaAs HEMTs within the range of 400 GHz cut-off frequency
-
Y. Yamashita, A. Endoh, K. Shinohara, M. Higashiwaki, K. Hikosaka, T. Mimura, S. Hiyamizu, T. Matsui, "Ultra-short 25-nm-gate lattice-matched InAlAs/ InGaAs HEMTs within the range of 400 GHz cut-off frequency", IEEE Electron Device Letters 22 (8) (2001) 367-369.
-
(2001)
IEEE Electron Device Letters
, vol.22
, Issue.8
, pp. 367-369
-
-
Yamashita, Y.1
Endoh, A.2
Shinohara, K.3
Higashiwaki, M.4
Hikosaka, K.5
Mimura, T.6
Hiyamizu, S.7
Matsui, T.8
-
2
-
-
0035506980
-
Ultrahigh-speed pseudomorphic InGaAs/InAlAs HEMTs with 400-GHz cutoff frequency
-
K. Shinohara, Y. Yamashita, A. Endoh, K. Hikosaka, T. Matsui, T. Mimura, and S. Hiyamizu, "Ultrahigh-Speed Pseudomorphic InGaAs/InAlAs HEMTs With 400-GHz Cutoff Frequency", IEEE Electron Device Letters 22 (11) (2001) 507-509.
-
(2001)
IEEE Electron Device Letters
, vol.22
, Issue.11
, pp. 507-509
-
-
Shinohara, K.1
Yamashita, Y.2
Endoh, A.3
Hikosaka, K.4
Matsui, T.5
Mimura, T.6
Hiyamizu, S.7
-
3
-
-
0036568336
-
Scaling of pseudomorphic high electron mobility transistors to decanano dimensions
-
K. Kalna, S. Roy, A. Asenov, K. Elgaid, and I. Thayne, "Scaling of pseudomorphic high electron mobility transistors to decanano dimensions", Solid-State Electron. 46 (2002) 631-638.
-
(2002)
Solid-State Electron
, vol.46
, pp. 631-638
-
-
Kalna, K.1
Roy, S.2
Asenov, A.3
Elgaid, K.4
Thayne, I.5
-
4
-
-
84907815610
-
RF analysis of aggressively scaled pHEMTs
-
ed. by W. A. Lane, G. M. Crean, F. A. McCabe and H. Grunbacher, Cork, Ireland
-
K. Kalna, S. Roy, A. Asenov, K. Elgaid, and I. Thayne, "RF analysis of aggressively scaled pHEMTs", in Proceedings of ESSDERC 2000, ed. by W. A. Lane, G. M. Crean, F. A. McCabe and H. Grunbacher, Cork, Ireland (2000) 156-159.
-
(2000)
Proceedings of ESSDERC 2000
, pp. 156-159
-
-
Kalna, K.1
Roy, S.2
Asenov, A.3
Elgaid, K.4
Thayne, I.5
-
5
-
-
0024699745
-
Importance of source and drain resistance to the maximum fT of millimeter-wave MODFET's
-
P.J. Tasker, B. Hughes, "Importance of source and drain resistance to the maximum fT of millimeter-wave MODFET's", IEEE Electron Device Letters 10 (7) (1989)291-293.
-
(1989)
IEEE Electron Device Letters
, vol.10
, Issue.7
, pp. 291-293
-
-
Tasker, P.J.1
Hughes, B.2
-
6
-
-
0035247262
-
Characteristics and comparison of In0.49Ga0.51P/InGaAs single and double-delta doped pseudomorphic high electron mobility transistors
-
K. W. Lin, K. H. Yu, W. L. Chang, C. C. Cheng, K. P. Lin, C. H. Yen, W. S. Lour, and W. C. Liu, "Characteristics and comparison of In0.49Ga0.51P/InGaAs single and double-delta doped pseudomorphic high electron mobility transistors", Solid-State Electron. 45 (2001) 309-314.
-
(2001)
Solid-State Electron
, vol.45
, pp. 309-314
-
-
Lin, K.W.1
Yu, K.H.2
Chang, W.L.3
Cheng, C.C.4
Lin, K.P.5
Yen, C.H.6
Lour, W.S.7
Liu, W.C.8
-
7
-
-
0013447503
-
Multiple delta doping in aggres-sively scaled PHEMTs
-
ed. by H. Ryssel, G. Wachutka, and H. Grunbacher
-
K. Kalna and A. Asenov, "Multiple delta doping in aggres-sively scaled PHEMTs", in Proc, ESSDERC 2001, ed. by H. Ryssel, G. Wachutka, and H. Grunbacher (2001) 380-384.
-
(2001)
Proc, ESSDERC 2001
, pp. 380-384
-
-
Kalna, K.1
Asenov, A.2
-
8
-
-
84907707481
-
Novel technologies for the realisation of GaAs pHEMTs with 120 nm self-aligned and nano-imprinted T-gates
-
(in process of publication)
-
D. Moran, E. Boyd, H. McLelland, K. Elgaid. Y. Chen, D. S. Macintyre, S. Thorns, C. R. Stanley, and I. G. Thayne, "Novel technologies for the realisation of GaAs pHEMTs with 120 nm self-aligned and nano-imprinted T-gates", in Proc. MNE 2002 (in process of publication).
-
(2002)
Proc. MNE
-
-
Moran, D.1
Boyd, E.2
McLelland, H.3
Elgaid, K.4
Chen, Y.5
Macintyre, D.S.6
Thorns, S.7
Stanley, C.R.8
Thayne, I.G.9
-
9
-
-
0030287906
-
A simple approach to include external resistances in the Monte Carlo simulation of MESFETs and HEMTs
-
S. Babiker, A. Asenov, N. Cameron, and S. P. Beaumont, "A simple approach to include external resistances in the Monte Carlo simulation of MESFETs and HEMTs", IEEE Trans. Electron Devices 43 (1996) 2032-2034.
-
(1996)
IEEE Trans. Electron Devices
, vol.43
, pp. 2032-2034
-
-
Babiker, S.1
Asenov, A.2
Cameron, N.3
Beaumont, S.P.4
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