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Volumn 18, Issue 5, 2005, Pages 327-340

Efficient three-dimensional parallel simulations of PHEMTs

Author keywords

3D simulations; Domain decomposition; Drift diffusion; HEMT; Parallel scalability

Indexed keywords

DOMAIN DECOMPOSITION; DRIFT-DIFFUSION; PARALLEL SCALABILITY; THREE-DIMENSIONAL (3D) SIMULATIONS;

EID: 24944462739     PISSN: 08943370     EISSN: None     Source Type: Journal    
DOI: 10.1002/jnm.581     Document Type: Article
Times cited : (10)

References (17)
  • 2
    • 0032320827 scopus 로고    scopus 로고
    • Random dopant induced threshold voltage lowering and fluctuations in sub 0.1 μm MOSFETs: A 3D 'Atomistic' simulation study
    • Asenov A. Random dopant induced threshold voltage lowering and fluctuations in sub 0.1 μm MOSFETs: a 3D 'Atomistic' simulation study. IEEE Transactions on Electron Devices 1998; 45:2505-2513.
    • (1998) IEEE Transactions on Electron Devices , vol.45 , pp. 2505-2513
    • Asenov, A.1
  • 11
    • 24944511383 scopus 로고    scopus 로고
    • Computer Science Department, Cornell University
    • Vavasis SA. QMG 1.1 Reference Manual. Computer Science Department, Cornell University, 1996.
    • (1996) QMG 1.1 Reference Manual
    • Vavasis, S.A.1
  • 15
    • 0345955590 scopus 로고    scopus 로고
    • PSPARSLIB users manual: A portable library of parallel sparse iterative solvers
    • Department of Computer Science, University of Minnesota
    • Saad Y, Lo G-C, Kuznetsov S. PSPARSLIB users manual: a portable library of parallel sparse iterative solvers. Technical Report, Department of Computer Science, University of Minnesota, 1997.
    • (1997) Technical Report
    • Saad, Y.1    Lo, G.-C.2    Kuznetsov, S.3
  • 16
    • 0035692855 scopus 로고    scopus 로고
    • Scaling of PHEMTs to decanano dimensions
    • Kalna K, Asenov A, Elgaid K, Thayne I. Scaling of PHEMTs to decanano dimensions. VLSI Design 2001; 13(1-4):435-439.
    • (2001) VLSI Design , vol.13 , Issue.1-4 , pp. 435-439
    • Kalna, K.1    Asenov, A.2    Elgaid, K.3    Thayne, I.4
  • 17
    • 0030287906 scopus 로고    scopus 로고
    • A simple approach to include external resistances in the Monte Carlo simulation of MESFETs and HEMTs
    • Babiker S, Asenov A, Cameron N, Beaumont SP. A simple approach to include external resistances in the Monte Carlo simulation of MESFETs and HEMTs. IEEE Transactions on Electron Devices 1996; 43:2032-2034.
    • (1996) IEEE Transactions on Electron Devices , vol.43 , pp. 2032-2034
    • Babiker, S.1    Asenov, A.2    Cameron, N.3    Beaumont, S.P.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.