Electrical studies of semiconductor-dielectric interfaces

Journal of Materials Science: Materials in Electronics

Volumn 17, Issue 9, 2006, Pages 663-683

  Jamal Deen, M ^a   Iñiguez, Benjamin ^b   Marinov, Ognian ^a   Lime, François ^b  

^a MCMASTER UNIVERSITY   (Canada)

^b UNIVERSITAT ROVIRA I VIRGILI   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; DIELECTRIC PROPERTIES; GATES (TRANSISTOR); INTERFACES (MATERIALS); PHYSICAL PROPERTIES; SEMICONDUCTING SILICON;

CHARACTERIZATION TECHNIQUES; GATE DIELECTRICS; SEMICONDUCTOR-DIELECTRIC INTERFACES;

MOSFET DEVICES;

EID: 33749247053     PISSN: 09574522     EISSN: 1573482X     Source Type: Journal    
DOI: 10.1007/s10854-006-0018-z     Document Type: Review

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