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Volumn 167, Issue 1, 1998, Pages 261-270
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Low frequency noise characterization of 0.18 μm Si CMOS transistors
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Author keywords
[No Author keywords available]
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Indexed keywords
CMOS INTEGRATED CIRCUITS;
ELECTRIC CURRENTS;
SEMICONDUCTING SILICON;
SIGNAL NOISE MEASUREMENT;
SPURIOUS SIGNAL NOISE;
RANDOM TELEGRAPH SIGNAL (RTS);
TRANSISTORS;
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EID: 0032069686
PISSN: 00318965
EISSN: None
Source Type: Journal
DOI: 10.1002/(SICI)1521-396X(199805)167:1<261::AID-PSSA261>3.0.CO;2-# Document Type: Article |
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Times cited : (25)
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References (15)
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