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Volumn 49, Issue 10, 2005, Pages 1632-1638

Studies of AlGaN/GaN high-electron-mobility transistors on 4-in. diameter Si and sapphire substrates

Author keywords

4 in. sapphire; 4 in. Si; AlGaN GaN HEMTs; Breakdown voltage; Device temperature; Infrared camera; Self heating

Indexed keywords

CAMERAS; ELECTRIC BREAKDOWN; GALLIUM NITRIDE; HEATING; INFRARED DEVICES; SAPPHIRE; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING SILICON; SUBSTRATES; THERMAL EFFECTS;

EID: 27744433089     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2005.08.014     Document Type: Article
Times cited : (40)

References (46)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.