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Volumn 71, Issue 14, 1997, Pages 2038-2040

Aluminum single-electron nonvolatile floating gate memory cell

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001487557     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.119780     Document Type: Article
Times cited : (43)

References (13)
  • 1
    • 0003973069 scopus 로고
    • edited by B. L. Al'tshuler, P. A. Lee, and R. A. Webb North-Holland, Amsterdam, Chap. 6
    • For a review, see, for example, D. V. Averin and K. K. Likharev, Mesoscopic Phenomena in Solids, edited by B. L. Al'tshuler, P. A. Lee, and R. A. Webb (North-Holland, Amsterdam, 1991), Chap. 6.
    • (1991) Mesoscopic Phenomena in Solids
    • Averin, D.V.1    Likharev, K.K.2
  • 3
    • 0027889406 scopus 로고
    • K. Yano, T. Ishii, T. Hashimoto, T. Kobayashi, F. Murai, and K. Seki, Tech. Dig. Int. Electron Devices Meet., 541 (1993); A. Nakajima, T. Futatsugi, K. Kosemura, T. Fukano, and N. Yokoyama, ibid., 952 (1996); L. Guo, E. Leobandung, and S. Y. Chou, ibid., 955 (1996); S. Tiwari, F. Rana, H. Hanafi, A. Hartstein, E. F. Crabbé. and K. Chan, Appl. Phys. Lett. 68, 1377 (1996).
    • (1993) Tech. Dig. Int. Electron Devices Meet. , pp. 541
    • Yano, K.1    Ishii, T.2    Hashimoto, T.3    Kobayashi, T.4    Murai, F.5    Seki, K.6
  • 4
    • 0030382660 scopus 로고    scopus 로고
    • K. Yano, T. Ishii, T. Hashimoto, T. Kobayashi, F. Murai, and K. Seki, Tech. Dig. Int. Electron Devices Meet., 541 (1993); A. Nakajima, T. Futatsugi, K. Kosemura, T. Fukano, and N. Yokoyama, ibid., 952 (1996); L. Guo, E. Leobandung, and S. Y. Chou, ibid., 955 (1996); S. Tiwari, F. Rana, H. Hanafi, A. Hartstein, E. F. Crabbé. and K. Chan, Appl. Phys. Lett. 68, 1377 (1996).
    • (1996) Tech. Dig. Int. Electron Devices Meet. , pp. 952
    • Nakajima, A.1    Futatsugi, T.2    Kosemura, K.3    Fukano, T.4    Yokoyama, N.5
  • 5
    • 5944256935 scopus 로고    scopus 로고
    • K. Yano, T. Ishii, T. Hashimoto, T. Kobayashi, F. Murai, and K. Seki, Tech. Dig. Int. Electron Devices Meet., 541 (1993); A. Nakajima, T. Futatsugi, K. Kosemura, T. Fukano, and N. Yokoyama, ibid., 952 (1996); L. Guo, E. Leobandung, and S. Y. Chou, ibid., 955 (1996); S. Tiwari, F. Rana, H. Hanafi, A. Hartstein, E. F. Crabbé. and K. Chan, Appl. Phys. Lett. 68, 1377 (1996).
    • (1996) Tech. Dig. Int. Electron Devices Meet. , vol.955
    • Guo, L.1    Leobandung, E.2    Chou, S.Y.3
  • 6
    • 0000298224 scopus 로고    scopus 로고
    • K. Yano, T. Ishii, T. Hashimoto, T. Kobayashi, F. Murai, and K. Seki, Tech. Dig. Int. Electron Devices Meet., 541 (1993); A. Nakajima, T. Futatsugi, K. Kosemura, T. Fukano, and N. Yokoyama, ibid., 952 (1996); L. Guo, E. Leobandung, and S. Y. Chou, ibid., 955 (1996); S. Tiwari, F. Rana, H. Hanafi, A. Hartstein, E. F. Crabbé. and K. Chan, Appl. Phys. Lett. 68, 1377 (1996).
    • (1996) Appl. Phys. Lett. , vol.68 , pp. 1377
    • Tiwari, S.1    Rana, F.2    Hanafi, H.3    Hartstein, A.4    Crabbé, E.F.5    Chan, K.6
  • 9
    • 0002596946 scopus 로고
    • edited by C. R. Helms and B. E. Deal Pergamon, Oxford
    • 2 Interface, edited by C. R. Helms and B. E. Deal (Pergamon, Oxford, 1988), p. 497.
    • (1988) 2 Interface , pp. 497
    • Maserjian, J.1
  • 12


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.