Stability of binary logic tunneling phase states in dc-biased and ac-pumped single-electron tunnel junctions

Applied Physics Letters

Volumn 69, Issue 26, 1996, Pages 4059-4061

  Ohshima, T ^a  

^a FUJITSU LABORATORIES LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0037615232     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117817     Document Type: Article

References (7)

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