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Volumn 53, Issue 20, 1996, Pages 13682-13687
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Background charge noise in metallic single-electron tunneling devices
a a a a a b b |
Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000085745
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.53.13682 Document Type: Article |
Times cited : (217)
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References (16)
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