Open loop Kelvin probe force microscopy with single and multi-frequency excitation

Nanotechnology

Volumn 24, Issue 47, 2013, Pages

  Collins, L ^a   Kilpatrick, J I ^a   Weber, S A L ^a   Tselev, A ^b   Vlassiouk, I V ^b   Ivanov, I N ^b   Jesse, S ^b   Kalinin, S V ^b   Rodriguez, B J ^a  

^a UNIVERSITY COLLEGE DUBLIN   (Ireland)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CLOSED LOOPS; CU FOIL; FEED-BACK LOOP; KELVIN PROBE FORCE MICROSCOPY; MEASUREMENT PARAMETERS; MULTI-FREQUENCY EXCITATION; MULTILAYER GRAPHENE; POTENTIAL DIFFERENCE;

CROSSTALK; ELECTROSTATICS; GRAPHENE; METAL CLADDING; PROBES;

ALUMINUM COATINGS;

EID: 84887578857     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/24/47/475702     Document Type: Article

References (58)

1. Nonnenmacher M, O'Boyle M P and Wickramasinghe H K 1991 Appl. Phys. Lett. 58 2921-3
2. Kelvin L, Fitzgerald G and Francis W 1898 Phil. Mag. 46 82-120
3. Binnig G, Quate C F and Gerber C 1986 Phys. Rev. Lett. 56 930-3
4. Sommerhalter C, Matthes T W, Glatzel T, Jager-Waldau A and Lux-Steiner M C 1999 Appl. Phys. Lett. 75 286-8
5. Sommerhalter C, Glatzel T, Matthes T W, Jäger-Waldau A and Lux-Steiner M C 2000 Appl. Surf. Sci. 157 263-8
6. Zerweck U, Loppacher C, Otto T, Grafström S and Eng L M 2005 Phys. Rev. B 71 125424
7. Ziegler D and Stemmer A 2011 Nanotechnology 22 075501
8. Fujihira M 1999 Annu. Rev. Mater. Sci. 29 353-80
9. Zerweck U, Loppacher C, Otto T, Grafström S and Eng L 2007 Nanotechnology 18 084006
10. Sadewasser S, Jelinek P, Fang C K, Custance O, Yamada Y, Sugimoto Y, Abe M and Morita S 2009 Phys. Rev. Lett. 103 266103
11. Sinensky A K and Belcher A M 2007 Nature Nanotechnol. 2 653-9
12. Leung C, Kinns H, Hoogenboom B W, Howorka S and Mesquida P 2009 Nano Lett. 9 2769-73
13. Knapp H F, Mesquida P and Stemmer A 2002 Surf. Interface Anal. 33 108-12
14. Tanimoto M and Vatel O 1996 J. Vac. Sci. Technol. B 14 1547-51
15. Loppacher C, Zerweck U, Teich S, Beyreuther E, Otto T, Grafstrom S and Eng L M 2005 Nanotechnology 16 S1-6
16. Liscio A, De Luca G, Nolde F, Palermo V, Müllen K and Samorì P 2008 J. Am. Chem. Soc. 130 780-1
17. Berger R, Domanski A L and Weber S A L 2013 Eur. Polym. J. 49 1907-15
18. Shvebelman M M, Agronin A G, Urenski R P, Rosenwaks Y and Rosenman G I 2002 Nano Lett. 2 455-8
19. Son J, Kim B G, Kim C and Cho J 2004 Appl. Phys. Lett. 84 4971
20. Kim Y, Park M, Bühlmann S, Hong S, Kim Y K, Ko H, Kim J and No K 2010 J. Appl. Phys. 107 054103
21. Cunningham S, Larkin I A and Davis J H 1998 Appl. Phys. Lett. 73 123
22. Jacobs H, Knapp H and Stemmer A 1999 Rev. Sci. Instrum. 70 1756
23. Mélin T, Barbet S, Diesinger H, Théron D and Deresmes D 2011 Rev. Sci. Instrum. 82 036101
24. Wu Y and Shannon M A 2006 Rev. Sci. Instrum. 77 043711
25. Liscio A, Palermo V, Müllen K and Samorí P 2008 J. Phys. Chem. C 44 17368-77
26. Efimov A and Cohen S R 2000 J. Vac. Sci. Technol. A 18 1051-5
27. Okamoto K, Sugawara Y and Morita S 2002 Appl. Surf. Sci. 188 381-5
28. Guo S, Kalinin S V and Jesse S 2012 Nanotechnology 23 125704
29. Collins L, Kilpatrick J I, Bhaskaran M, Sriram S, Weber S A L, Jarvis S P and Rodriguez B J 2012 ISAF/ECAPD/PFM: IEEE 2012 Int. Symp. Applications of Ferroelectrics Held Jointly with 2012 European Conf. on the Applications of Polar Dielectrics and 2012 Int. Symp. Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials pp 1-4
30. Takeuchi O, Ohrai Y, Yoshida S and Shigekawa H 2007 Japan. J. Appl. Phys., 1 46 5626
31. Coffey D C and Ginger D S 2006 Nature Mater. 5 735-40
32. Strelcov E, Jesse S, Huang Y L, Teng Y C, Kravchenko I I, Chu Y H and Kalinin S V 2013 ACS Nano 7 6806-15
33. Bayerl D J and Wang X 2012 Adv. Funct. Mater. 22 652-60
34. Kobayashi N, Asakawa H and Fukuma T 2010 Rev. Sci. Instrum. 81 123705
35. Kobayashi N, Asakawa H and Fukuma T 2011 J. Appl. Phys. 110 044315
36. Kobayashi N, Asakawa H and Fukuma T 2012 Rev. Sci. Instrum. 83 033709
37. Kalinin S V and Bonnell D A 2001 Phys. Rev. B 63 125411
38. Cherniavskaya O, Chen L W, Weng V, Yuditsky L and Brus L E 2003 J. Phys. Chem. B 107 1525-31
39. Leung C, Maradan D, Kramer A, Howorka S, Mesquida P and Hoogenboom B W 2010 Appl. Phys. Lett. 97 203703
40. Diesinger H, Deresmes D and Mélin T 2012 Kelvin Probe Force Microscopy vol 48 ed S Sadewasser and T Glatzel (Berlin: Springer) pp 25-44
41. Jesse S, Guo S, Kumar A, Rodriguez B J, Proksch R and Kalinin S V 2010 Nanotechnology 21 405703
42. Yoshida S, Kikuchi J, Kanitani Y, Takeuchi O, Oigawa H and Shigekawa H 2006 e-J. Surf. Sci. Nanotechnol. 4 192-6
43. Guo S, Kalinin S V and Jesse S 2012 Appl. Phys. Lett. 100 063118
44. Rodriguez B J, Callahan C, Kalinin S V and Proksch R 2007 Nanotechnology 18 475504
45. Jesse S, Kalinin S V, Proksch R, Baddorf A and Rodriguez B 2007 Nanotechnology 18 435503
46. Vlassiouk I, Regmi M, Fulvio P, Dai S, Datskos P, Eres G and Smirnov S 2011 ACS Nano 5 6069-76
47. Vlassiouk I, Fulvio P, Meyer H, Lavrik N, Dai S, Datskos P and Smirnov S 2013 Carbon 54 58-67
48. Dresselhaus A J, Hotman M, Dresselhaus G and Saito R 2010 Nano Lett. 3 751-8
49. Ferrari A, Meyer J, Scardaci V, Casiraghi C, Lazzeri M, Mauri F, Piscanec S, Jiang D, Novoselov K and Roth S 2006 Phys. Rev. Lett. 97 187401
50. Malard L, Pimenta M, Dresselhaus G and Dresselhaus M 2009 Phys. Rep. 473 51-87
51. Havener R W, Zhuang H, Brown L, Hennig R G and Park J 2012 Nano Lett. 6 3162-7
52. Yu Y J, Zhao Y, Ryu S, Brus L E, Kim K S and Kim P 2009 Nano Lett. 9 3430-4
53. Ziegler D, Gava P, Güttinger J, Molitor F, Wirtz L, Lazzeri M, Saitta A, Stemmer A, Mauri F and Stampfer C 2011 Phys. Rev. B 83 235434
54. Fumagalli L, Ferrari G, Sampietro M and Gomila G 2009 Nano Lett. 9 1604-8
55. Fumagalli L, Esteban-Ferrer D, Cuervo A, Carrascosa J L and Gomila G 2012 Nature Mater. 11 808-16
56. Lucchesi M, Privitera G, Labardi M, Prevosto D, Capaccioli S and Pingue P 2009 J. Appl. Phys. 105 054301
57. Nguyen H K, Labardi M, Capaccioli S, Lucchesi M, Rolla P and Prevosto D 2012 Macromolecules 45 2138-44
58. García R and Herruzo E T 2012 Nature Nanotechnol. 7 217-26