Kelvin probe force microscopy of C60 on metal substrates: Towards molecular resolution

Nanotechnology

Volumn 18, Issue 8, 2007, Pages

  Zerweck, U ^a   Loppacher, Ch ^a   Otto, T ^a   Grafstrom S ^a   Eng, L M ^a  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; MOLECULAR SPECTROSCOPY; PHOTOELECTRON SPECTROSCOPY; SUBSTRATES; SURFACE STRUCTURE;

KELVIN PROBE FORCE MICROSCOPY (KPFM); METAL SUBSTRATES; SURFACE WORKFUNCTION;

SINGLE CRYSTALS;

CHROMIUM; FULLERENE DERIVATIVE; METAL;

ADSORPTION; CONFERENCE PAPER; CRYSTAL; LINEAR SYSTEM; MICROSCOPY; MOLECULAR PROBE; PREDICTION; PRIORITY JOURNAL; QUANTITATIVE ANALYSIS; SIMULATION; SURFACE PROPERTY;

EID: 33947544178     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/18/8/084006     Document Type: Conference Paper

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