Three-dimensional Kelvin probe microscopy for characterizing in-plane piezoelectric potential of laterally deflected ZnO micro-/nanowires

Advanced Functional Materials

Volumn 22, Issue 3, 2012, Pages 652-660

  Bayerl, Dylan J ^a   Wang, Xudong ^a  

^a UNIVERSITY OF WISCONSIN MADISON   (United States)

Author keywords

kelvin probe microscopy; microwires; nanowires; piezoelectric materials; potential characterization; zinc oxide

Indexed keywords

AFM TIP; ATOMIC FORCE MICROSCOPES; COUPLING PHENOMENA; ELECTRICAL POTENTIAL; IN-PLANE; KELVIN PROBE MICROSCOPY; MEASUREMENT RESULTS; MECHANICAL ENERGIES; MICRO WIRE; MICRO/NANOSTRUCTURES; MOTION DECOUPLING; NANO-DEVICES; PIEZOELECTRIC POTENTIAL; SAMPLE SURFACE; SPATIAL VOLUME; THEORETICAL PREDICTION; THREE-DIMENSIONAL (3D); TOPOGRAPHICAL VARIATIONS; ZNO;

ATOMIC FORCE MICROSCOPY; CHARACTERIZATION; NANOWIRES; PIEZOELECTRIC MATERIALS; PROBES; SPECTROSCOPIC ANALYSIS; THREE DIMENSIONAL; ZINC OXIDE;

PIEZOELECTRICITY;

EID: 84863058662     PISSN: 1616301X     EISSN: 16163028     Source Type: Journal    
DOI: 10.1002/adfm.201102325     Document Type: Article

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