Kelvin probe force microscopy without bias-voltage feedback

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 46, Issue 8 B, 2007, Pages 5626-5630

  Takeuchi, Osamu ^a   Ohrai, Yoshihisa ^a   Yoshida, Shoji ^a   Shigekawa, Hidemi ^a  

^a UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

Atomic force microscopy; Kelvin probe force microscopy

Indexed keywords

BIAS VOLTAGE; CANTILEVER BEAMS; ELECTROSTATICS; SIGNAL ANALYSIS;

FINITE BIAS VOLTAGE; KELVIN PROBE FORCE MICROSCOPY;

ATOMIC FORCE MICROSCOPY;

EID: 34548262313     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.46.5626     Document Type: Article

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