Half-harmonic Kelvin probe force microscopy with transfer function correction

Applied Physics Letters

Volumn 100, Issue 6, 2012, Pages

  Guo, Senli ^a   Kalinin, Sergei V ^a   Jesse, Stephen ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

KELVIN PROBE FORCE MICROSCOPY; MODEL SYSTEM; PRIMARY SOURCES; QUANTITATIVE CORRECTIONS; QUANTITATIVE SEPARATION;

PROBES; SPECTROSCOPIC ANALYSIS; SURFACE POTENTIAL; TRANSFER FUNCTIONS;

HARMONIC ANALYSIS;

EID: 84857214168     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3684274     Document Type: Article

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