Improved Kelvin probe force microscopy for imaging individual DNA molecules on insulating surfaces

Applied Physics Letters

Volumn 97, Issue 20, 2010, Pages

  Leung, Carl ^a,b   Maradan, Dario ^a,c   Kramer, Armin ^a   Howorka, Stefan ^a   Mesquida, Patrick ^b   Hoogenboom, Bart W ^a  

^a UNIVERSITY COLLEGE LONDON   (United Kingdom)

^b KING'S COLLEGE LONDON   (United Kingdom)

^c UNIVERSITY OF BASEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ACID MOLECULES; DNA MOLECULES; DUAL-FREQUENCY MODE; ELECTROSTATIC SURFACES; FUNDAMENTAL RESONANCE; INSULATING SURFACES; KELVIN PROBE; KELVIN PROBE FORCE MICROSCOPY; SILICON SURFACES; TIP-SAMPLE DISTANCE;

ELECTROSTATICS; MICA; NUCLEIC ACIDS; PROBES; SILICATE MINERALS; SURFACE POTENTIAL; SURFACE PROPERTIES;

SURFACE TOPOGRAPHY;

EID: 78649260205     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3512867     Document Type: Article

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