Note: Quantitative (artifact-free) surface potential measurements using Kelvin force microscopy

Review of Scientific Instruments

Volumn 82, Issue 3, 2011, Pages

  Melin T ^a   Barbet, S ^a   Diesinger, H ^a   Theron D ^a   Deresmes, D ^a  

^a INSTITUT D ELECTRONIQUE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AMBIENT AIR; CANTILEVER EXCITATION; EXTERNAL PERTURBATIONS; INTERNAL PARAMETERS; KELVIN FORCE MICROSCOPY; SURFACE POTENTIAL MEASUREMENTS;

SURFACE PROPERTIES;

SURFACE POTENTIAL;

EID: 79953658276     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3516046     Document Type: Article

References (16)

1. Y. Martin, D. W. Abraham, and H. K. Wickramasinghe, Appl. Phys. Lett. 52, 1103 (1988); 10.1063/1.99224
2. M. Nonnenmacher, M. P. OBoyle, and H. K. Wickramasinghe, Appl. Phys. Lett. 58, 2921 (1991). 10.1063/1.105227
3. H. O. Jacobs, H. F. Knapp, and A. Stemmer, Rev. Sci. Instrum. 70, 1756 (1999). 10.1063/1.1149664
4. S. Barbet, R. Aubry, M.-A. di Forte-Poisson, J.-C. Jacquet, D. Deresmes, T. Mélin, and D. Théron, Appl. Phys. Lett. 93, 212107 (2008). 10.1063/1.3028639
5. W. N. Hansen and G. J. Hansen, Surf. Sci. 481, 172 (2001). 10.1016/S0039-6028(01)01036-6 (Pubitemid 32543643)
6. The issues have also been found on Dimension/Nanoscope IV AFMs from the same manufacturer.
7. The KFM loop angle corresponds also to the so-called drive phase.
8. s(z).
9. dc stems from C/z (capacitive force at the basis of the Kelvin probe) even though the cross-talk is not assumed to depend on z. This can be understood from Eq..
10. Y. Wu and M. A. Shannon, Rev. Sci. Instrum. 77, 043711 (2006). 10.1063/1.2195104
11. A detailed characterization of the ac cross-talks will be provided separately. We here rather focus on a compensation/suppression protocol.
12. This coupling can be important on ultra-vacuum KFM set-ups for which cross-talks can be attenuated using shielded cables, see C. Sommerhalter, T. W. Matthes, T. Glatze, A. Jager-Waldau, and M. C. Lux-Steiner, Appl. Phys. Lett. 75, 286 (1999); 10.1063/1.124357
13. or externally compensated, see H. Diesinger, D. Deresmes, J. P. Nys, and T. Mélin, Ultramicroscopy 108, 773 (2008). 10.1016/j.ultramic.2008.01.003
14. The amplitude of the ac cross-talk is likely microscope dependent.
15. The effectiveness of this ac cross-talk will depend on the ac excitation required to mechanically excite a given cantilever by piezo actuation.
16. exc.