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Volumn 12, Issue 6, 2012, Pages 3162-3167

Angle-resolved raman imaging of interlayer rotations and interactions in twisted bilayer graphene

Author keywords

dark field TEM; Graphene; imaging; Raman spectroscopy; twisted bilayer

Indexed keywords

ANGLE-DEPENDENT; BAND INTENSITY; BI-LAYER; DARK-FIELD; DARK-FIELD TRANSMISSION ELECTRON MICROSCOPY; FEW-LAYER GRAPHENE; INTERLAYER INTERACTIONS; JOINT DENSITY OF STATE; LAYERED MATERIAL; OPTICAL IMAGING; OPTICAL PHENOMENA; RAMAN IMAGING; RAMAN INTENSITIES; RELATIVE ORIENTATION; STRUCTURE-PROPERTY CORRELATION; TRANSITION STRENGTHS; TWIST ANGLES; WIDE-FIELD;

EID: 84862301592     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl301137k     Document Type: Article
Times cited : (330)

References (33)
  • 23
    • 84862290294 scopus 로고    scopus 로고
    • Kim, K.; Coh, S.; Tan, L. Z.; Regan, W.; Yuk, J. M.; Chatterjee, E.; Crommie, M. F.; Cohen, M. L.; Louie, S. G.; Zettl, A. arXiv:1201.4221v2, 2012.
    • Kim, K.; Coh, S.; Tan, L. Z.; Regan, W.; Yuk, J. M.; Chatterjee, E.; Crommie, M. F.; Cohen, M. L.; Louie, S. G.; Zettl, A. arXiv:1201.4221v2, 2012.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.