Dual harmonic Kelvin probe force microscopy for surface potential measurements of ferroelectrics

Proceedings of 2012 21st IEEE Int. Symp. on Applications of Ferroelectrics held jointly with 11th IEEE European Conference on the Applications of Polar Dielectrics and IEEE PFM, ISAF/ECAPD/PFM 2012

Volumn , Issue , 2012, Pages

  Collins, L ^a   Kilpatrick, J I ^a   Bhaskaran, M ^b   Sriram, S ^b   Weber, S A L ^a   Jarvis, S P ^a   Rodriguez, B J ^a  

^a UNIVERSITY COLLEGE DUBLIN   (Ireland)

^b RMIT UNIVERSITY   (Australia)

Author keywords

capacitance mapping; dual harmonic Kelvin probe force microscopy; ferroelectric materials; Kelvin probe force microscopy; piezoresponse force microscopy; surface potential mapping

Indexed keywords

BISMUTH FERRITES; DC BIAS; ELECTRIC CHARACTERIZATION; ELECTRICAL CHARACTERIZATION; ELECTROCHEMICAL REACTIONS; KELVIN PROBE FORCE MICROSCOPY; NON-INTRUSIVE; PIEZORESPONSE FORCE MICROSCOPY; POLARIZATION CHARGES; POLARIZATION SWITCHING; QUANTITATIVE MAPPING; STRONTIUM BARIUM NIOBATE; SURFACE LAYERS; SURFACE POTENTIAL MEASUREMENTS; THIN SURFACE LAYER;

BISMUTH; CHARACTERIZATION; DIELECTRIC PROPERTIES; FERROELECTRIC THIN FILMS; HARMONIC ANALYSIS; PROBES; SURFACE POTENTIAL; SURFACE TOPOGRAPHY;

FERROELECTRIC MATERIALS;

EID: 84867905106     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISAF.2012.6297845     Document Type: Conference Paper

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