Quantitative noncontact electrostatic force imaging of nanocrystal polarizability

Journal of Physical Chemistry B

Volumn 107, Issue 7, 2003, Pages 1525-1531

  Cherniavskaya, Oksana ^a   Chen, Liwei ^a   Weng, Vivian ^a   Yuditsky, Leonid ^a,b   Brus, Louis E ^a  

^a Och Spine at New York Presbyterian Hospitals   (United States)

^b Wyman and Company   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CALIBRATION; CAPACITANCE; ELECTRIC FIELD EFFECTS; ELECTROSTATICS; GOLD; IMAGING TECHNIQUES; SELF ASSEMBLY; SUBSTRATES; SURFACE TOPOGRAPHY;

ELECTROSTATIC FORCE MICROSCOPY (EFM);

NANOSTRUCTURED MATERIALS;

EID: 0037456408     PISSN: 10895647     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp0265438     Document Type: Article

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