Tip-induced band bending and its effect on local barrier height measurement studied by light-modulated scanning tunneling spectroscopy

e-Journal of Surface Science and Nanotechnology

Volumn 4, Issue , 2006, Pages 192-196

  Yoshida, Shoji ^a   Kikuchi, Junichi ^a   Kanitani, Yuya ^a   Takeuchi, Osamu ^a   Oigawa, Haruhiro ^a   Shigekawa, Hidemi ^a  

^a UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

Local barrier height; Scanning Tunneling Microscopy; Si(001); Surface photovoltage; Tip induced band bending

Indexed keywords

ELECTRIC POTENTIAL; ELECTRONIC STRUCTURE; LIGHT MODULATION; SCANNING TUNNELING MICROSCOPY; SILICON;

LOCAL BARRIER HEIGHT (LBH); SURFACE PHOTOVOLTAGE; TIP-INDUCED BAND BENDING;

SURFACE STRUCTURE;

EID: 32644435232     PISSN: 13480391     EISSN: 13480391     Source Type: Journal    
DOI: 10.1380/ejssnt.2006.192     Document Type: Article

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