Electrical characterization of organic solar cell materials based on scanning force microscopy

European Polymer Journal

Volumn 49, Issue 8, 2013, Pages 1907-1915

  Berger, Rüdiger ^a   Domanski, Anna L ^a   Weber, Stefan A L ^a,b  

^a MAX PLANCK INSTITUTE FOR POLYMER RESEARCH   (Germany)

^b UNIVERSITY COLLEGE DUBLIN   (Ireland)

Author keywords

Conductive scanning force microscopy; Degradation; Kelvin probe force microscopy; Photo current AFM; Solar cell; Time resolved EFM

Indexed keywords

AFM; ELECTRICAL CHARACTERIZATION; FUTURE CHALLENGES; KELVIN PROBE FORCE MICROSCOPY; LIGHT-INDUCED PROCESS; ORGANIC SOLAR CELL; SCANNING FORCE MICROSCOPES; TIME-RESOLVED;

DEGRADATION; LIGHT SOURCES; SCANNING PROBE MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SOLAR CELLS;

ELECTRIC PROPERTIES;

EID: 84880169632     PISSN: 00143057     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.eurpolymj.2013.03.005     Document Type: Conference Paper

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