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Volumn 7, Issue 4, 2012, Pages 217-226

The emergence of multifrequency force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; NANOCANTILEVERS;

EID: 84859578492     PISSN: 17483387     EISSN: 17483395     Source Type: Journal    
DOI: 10.1038/nnano.2012.38     Document Type: Review
Times cited : (520)

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