Writing polarization bits on the multiferroic BiMnO3 thin film using Kelvin probe force microscope

Applied Physics Letters

Volumn 84, Issue 24, 2004, Pages 4971-4973

  Son, J Y ^a   Kim, Bog Q ^a   Kim, C H ^a   Cho, J H ^a  

^a Pusan National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; CRYSTAL ORIENTATION; EPITAXIAL GROWTH; FERROELECTRICITY; MAGNETIC DOMAINS; MAGNETIC MOMENTS; MORPHOLOGY; NEODYMIUM LASERS; PULSED LASER DEPOSITION; REMANENCE; X RAY DIFFRACTION ANALYSIS;

FERROELECTRIC POLARIZATION; FULL WIDTH AT HALF MAXIMUM (FWHM); KELVIN FORCE MICROSCOPE (KFM); MULTIFERROIC PROPERTIES;

THIN FILMS;

EID: 3042814545     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1762974     Document Type: Article

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