Electrostatic force microscopy and potentiometry of realistic nanostructured systems

Journal of Applied Physics

Volumn 105, Issue 5, 2009, Pages

  Lucchesi, Mauro ^a,b   Privitera, Giulia ^a,d   Labardi, Massimiliano ^b   Prevosto, Daniele ^b   Capaccioli, Simone ^a,b   Pingue, Pasqualantonio ^c  

^a UNIVERSITY OF PISA   (Italy)

^b CNR   (Italy)

^c SCUOLA NORMALE SUPERIORE   (Italy)

^d UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC WIRE; ELECTROSTATIC DEVICES; ELECTROSTATIC SEPARATORS; POTENTIOMETERS (ELECTRIC MEASURING INSTRUMENTS); PROBES;

APPLIED POTENTIALS; CAPACITANCE MODELS; COMPLEX TOPOGRAPHIES; DATA INTERPRETATIONS; ELECTROSTATIC FORCE MICROSCOPIES; ELECTROSTATIC INTERACTIONS; FORCE GRADIENTS; KELVIN PROBE MICROSCOPIES; NANOSTRUCTURED SYSTEMS; NUMERICAL SIMULATIONS; PHYSICAL MEANINGS; POTENTIAL DIFFERENCES; POTENTIOMETRY; RIGOROUS MODELING; SEMICONDUCTOR NANOWIRES; STRIPE ELECTRODES;

ELECTROSTATIC FORCE;

EID: 62549123706     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3082125     Document Type: Article

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