Size-controlled InGaN/GaN nanorod array fabrication and optical characterization

Optics Express

Volumn 21, Issue 14, 2013, Pages 16854-16862

  Bae, Si Young ^a   Kong, Duk Jo ^a   Lee, Jun Yeob ^a   Seo, Dong Ju ^a   Lee, Dong Seon ^a  

^a Gwangju Institute of Science and Technology (GIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL CONSTANTS; OPTICS;

AVERAGE DIAMETER; HIGH-EFFICIENCY; INTERNAL QUANTUM EFFICIENCY; OPTICAL CHARACTERIZATION; POTENTIAL FLUCTUATIONS; STRAIN DISTRIBUTIONS; TOP-DOWN APPROACH; TREATMENT PROCESS;

NANORODS;

GALLIUM; GALLIUM NITRIDE; INDIUM; INDIUM NITRIDE; NANOTUBE;

BIREFRINGENCE; CHEMISTRY; CRYSTALLIZATION; LIGHT; MATERIALS TESTING; PARTICLE SIZE; PROCEDURES; ULTRASTRUCTURE; YOUNG MODULUS; ARTICLE; METHODOLOGY;

BIREFRINGENCE; CRYSTALLIZATION; ELASTIC MODULUS; GALLIUM; INDIUM; LIGHT; MATERIALS TESTING; NANOTUBES; PARTICLE SIZE;

EID: 84880530240     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.21.016854     Document Type: Article

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