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Volumn 25, Issue 8, 2013, Pages 1332-1350

Imaging impurities in semiconductor nanostructures

Author keywords

annular dark field scanning transmission electron microscopy; atom probe tomography; colloidal quantum dots; dopant imaging; doping; electron energy loss spectroscopy; impurity imaging; in situ transmission electron microscopy; semiconductor nanocrystals; semiconductor nanowires; solotronics

Indexed keywords

ATOM PROBE TOMOGRAPHY; COLLOIDAL QUANTUM DOTS; IN-SITU TRANSMISSION ELECTRON MICROSCOPIES; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SEMICONDUCTOR NANOCRYSTALS; SEMICONDUCTOR NANOWIRE; SOLOTRONICS;

EID: 84876725841     PISSN: 08974756     EISSN: 15205002     Source Type: Journal    
DOI: 10.1021/cm400004x     Document Type: Review
Times cited : (24)

References (142)
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    • (1970) Springer Tracts in Modern Physics , vol.54 , pp. 77-135
    • Daniels, J.1    Festenberg, C.V.2    Raether, H.3    Zeppenfeld, K.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.