Single atom spectroscopy with reduced delocalization effect using a 30 kV-STEM

EPJ Applied Physics

Volumn 54, Issue 3, 2011, Pages

  Suenaga, K ^a   Iizumi, Y ^a   Okazaki, T ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATING VOLTAGES; DELOCALIZATION EFFECTS; DELOCALIZATIONS; METALLOFULLERENES; SCANNING TRANSMISSION ELECTRON MICROSCOPES; SINGLE ATOM SPECTROSCOPY; SINGLE ATOMS;

ATOMS; CHEMICAL ANALYSIS; ELECTRON ENERGY LOSS SPECTROSCOPY; FULLERENES; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC SPECTROSCOPY;

EID: 79958783181     PISSN: 12860042     EISSN: 12860050     Source Type: Journal    
DOI: 10.1051/epjap/2011100414     Document Type: Article

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